2012
DOI: 10.1088/1742-6596/398/1/012003
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Common mistakes in luminescence analysis

Abstract: Abstract. Luminescence techniques are powerful and sensitive probes to study imperfections, impurities and modifications of insulating materials. They are used in a wide range of disciplines from condensed matter physics to archaeology and mineralogy and the methods have developed over nearly a century. Early equipment was often not quantitative and data were collected in formats that were difficult to process and manipulate, and so signals were frequently presented in terms of the initial signals without corr… Show more

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Cited by 25 publications
(10 citation statements)
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“…4B ). The former include emission wavelength-dependent sensitivities of photon-collecting, -counting and - converting (into electrical signals) optical detectors in commercially available luminescence plate readers ( 45 ). For instance, a higher sensitivity in detecting increases in emission intensity in the cpVenus channel would artificially elevate the sensor’s BRET ratio over increasing relative luminescence units (e.g.…”
Section: Resultsmentioning
confidence: 99%
“…4B ). The former include emission wavelength-dependent sensitivities of photon-collecting, -counting and - converting (into electrical signals) optical detectors in commercially available luminescence plate readers ( 45 ). For instance, a higher sensitivity in detecting increases in emission intensity in the cpVenus channel would artificially elevate the sensor’s BRET ratio over increasing relative luminescence units (e.g.…”
Section: Resultsmentioning
confidence: 99%
“…Figure 9 depicts the deconvolution of the photoluminescent spectrum of the D2’ film. To perform the deconvolution and in order to avoid common errors reported in the photoluminescence analysis, the spectra were deconvolved using the PL intensity-energy differential versus energy [ 41 ].…”
Section: Resultsmentioning
confidence: 99%
“…The HRTEM On the other hand, Figures 9 and 10 show the photoluminescent (PL) emission spectra of the single-layer SRO films and Figures 11 and 12 show the twofold-layers SRO films, both on Quartz and Silicon substrates, as-G and with HT. In the graphs of Figure 9, 10, 11, and 12 a,b, are showing the PL spectra as they were just obtained to compare the intensity PL as-G and with HT, while in the insets of Figure 9, 10, 11, and 12c,d, the spectra were plotted according to the Energy I (E) dE versus the energy ratio given by Y. Wang and PD Townsend [32], to obtain the graphs in terms of energy and With the experimental values of the Eg opt it is possible to estimate the Si-ncs size (d = Si-ncs diameter) using Equation (2) [28], thus the calculated diameters are shown in Table 4 together with the corresponding Eg opt of each film.…”
Section: Resultsmentioning
confidence: 99%
“…On the other hand, Figures 9 and 10 show the photoluminescent (PL) emission spectra of the single-layer SRO films and Figures 11 and 12 show the twofold-layers SRO films, both on Quartz and Silicon substrates, as-G and with HT. In the graphs of Figures 9, 10, 11 and 12a,b, are showing the PL spectra as they were just obtained to compare the intensity PL as-G and with HT, while in the insets of Figures 9, 10, 11 and 12c,d, the spectra were plotted according to the Energy I (E) dE versus the energy ratio given by Y. Wang and PD Townsend [32], to obtain the graphs in terms of energy and perform the deconvolutions that determine the most intense energy peaks and thus relate them with the emission mechanisms. It is emphasized that the evolution of the peaks in the PL spectra both in their intensity and in the wavelength shifted from their position is attributed mainly to the heat-treated carried out at 1100 • C for 60 min in N 2 atmosphere.…”
Section: Resultsmentioning
confidence: 99%