2015
DOI: 10.1007/s10825-015-0772-3
|View full text |Cite
|
Sign up to set email alerts
|

Compact 2D modeling and drain current performance analysis of a work function engineered double gate tunnel field effect transistor

Help me understand this report

Search citation statements

Order By: Relevance

Paper Sections

Select...
5

Citation Types

0
5
0

Year Published

2016
2016
2021
2021

Publication Types

Select...
8
1

Relationship

2
7

Authors

Journals

citations
Cited by 32 publications
(5 citation statements)
references
References 32 publications
0
5
0
Order By: Relevance
“…These models are highly desirable because they offer better computational efficiency than their numerical alternatives without loss of physical insights. Since T. Kacprzak et al had reported firstly the compact DC model of GaAs-FETs in 1983 [28], the compact model for FETs has received much attention [29][30][31][32][33]. Fig.…”
Section: Introductionmentioning
confidence: 99%
See 1 more Smart Citation
“…These models are highly desirable because they offer better computational efficiency than their numerical alternatives without loss of physical insights. Since T. Kacprzak et al had reported firstly the compact DC model of GaAs-FETs in 1983 [28], the compact model for FETs has received much attention [29][30][31][32][33]. Fig.…”
Section: Introductionmentioning
confidence: 99%
“…Since Kacprzak et al reported firstly the compact DC model of GaAs-FETs in 1983, [28] the compact model for FETs has received much attention. [29][30][31][32][33] [34,35] which is based on the charge sheet model of MOSFET. Following Meric's model, several evolving compact models have been established, [36][37][38][39] such as, virtual-source current-voltage model, SPICE-compatible compact model, and electrical compact model, etc.…”
Section: Introductionmentioning
confidence: 99%
“…In many literature numerous structures and ideas have been reported to suppress the ambipolarity which includes gate-drain underlap [16] and gate-drain overlap [17,18] techniques but that causes a profound impact on the gate-drain capacitance and ON current level. The work function engineered dual metal, triple metal and linearly graded tunnel FETs [14], [19,20] reduces the ambipolarity but at the cost of an increase in Miller capacitance which affects the high-frequency parameters. Moreover, the heterodielectric TFETs [21] are also reported to suppress the ambipolar current.…”
Section: Introductionmentioning
confidence: 99%
“…The primary constrains concerning TFET devices are ambipolar conduction [13, 14], which originates from the BTBT at the drain–channel junction and other is low ON current, which are considerably poorer than MOSFETs. Various improvements have been investigated to compensate for these limitations faced by TFETs [15, 16].…”
Section: Introductionmentioning
confidence: 99%