2009
DOI: 10.1063/1.3073824
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Composition control and thickness dependence of {100}-oriented epitaxial BiCoO3–BiFeO3 films grown by metalorganic chemical vapor deposition

Abstract: Articles you may be interested inHigh symmetric SrRuO3 (001) thin films: Perfectly lattice-matched electrodes for multiferroic BiFeO3 J. Appl. Phys. 113, 17D913 (2013); 10.1063/1.4795864Multiferroic and structural properties of BiFeO3 close to the strain induced phase transition on different substrates Fabrication of ferroelectric SrBi 2 Ta 2 O 9 capacitor films using plasma-assisted metalorganic chemical vapor deposition and their electrical properties xBiCoO 3 -͑1−x͒BiFeO 3 films were deposited by metalorgan… Show more

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Cited by 17 publications
(10 citation statements)
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“…It is obtained a remanent polarization of 53µC/cm 2 , similar to that obtained for epitaxial BFCO films and slightly higher than pristine BFO films. 21,60 Note that similar behavior is also identified in thicker (> 300 nm) (La)BFO polycrystalline films but at significantly lower Co dopings ( 2-3%). 61,62 Additionally, piezoelectric characterization has been performed in La-BFCO LSMO-buffered 20 nm films.…”
Section: Resultssupporting
confidence: 60%
“…It is obtained a remanent polarization of 53µC/cm 2 , similar to that obtained for epitaxial BFCO films and slightly higher than pristine BFO films. 21,60 Note that similar behavior is also identified in thicker (> 300 nm) (La)BFO polycrystalline films but at significantly lower Co dopings ( 2-3%). 61,62 Additionally, piezoelectric characterization has been performed in La-BFCO LSMO-buffered 20 nm films.…”
Section: Resultssupporting
confidence: 60%
“…The X-ray experiments of Azuma et al [7] confirmed that, as the Co content grows, BFCO moves from R to T traversing a narrow region of presumably monoclinic (M ) symmetry. (Similar results have been obtained for thin films [8].) This is reminiscent of what occurs in prototype piezoelectric PbZr 1−x Ti x O 3 (PZT), where the M phase found at the MPB [9] is characterized by its structural softness and large electromechanical responses [10].…”
supporting
confidence: 78%
“…The crystal structure of the film was changed by film thickness. 17) The changes in XRD patterns with x value are shown in Figs. 1(a) and 1(b) for (1 À x)BiFeO 3 -xBiCoO 3 films of about 200 and 400 nm thickness, respectively, grown on (100)SrTiO 3 substrates.…”
Section: Resultsmentioning
confidence: 99%
“…unit) Two types of rhombohedral symmetries labeled R-1 and R-2 and their phase stability are already described elsewhere. 16,17) When the x value increased at a thickness below 200 nm, the crystal symmetry changed from rhombohedral to tetragonal symmetry through the mixture of these symmetries. Finally, it reached the region where the perovskite phase with tetragonal symmetry including impurities was obtained at a thickness above 200 nm.…”
Section: Resultsmentioning
confidence: 99%
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