2000
DOI: 10.1016/s0968-4328(99)00090-6
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Correlation between shape and electronic states in nanostructures

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Cited by 7 publications
(2 citation statements)
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“…The dot morphology was studied by contact mode atomic force microscopy and scanning tunneling microscopy, 12 in free standing dots. Cross sectional transmission electron microscopy and PL measurements were performed on QD samples overgrowth by a GaAs capping layer 30 nm thick.…”
mentioning
confidence: 99%
“…The dot morphology was studied by contact mode atomic force microscopy and scanning tunneling microscopy, 12 in free standing dots. Cross sectional transmission electron microscopy and PL measurements were performed on QD samples overgrowth by a GaAs capping layer 30 nm thick.…”
mentioning
confidence: 99%
“…The influence of compositional disorder, wire shape and wire size on the electronic states has been investigated in both types of wires by PL and PLE, and compared to the calculated wavefunctions in the different structures [5]. The theoretical model is based on the solution of the Schrödinger equation for the envelope functions:…”
mentioning
confidence: 99%