Degradation behavior of 0.98-μm strained quantum well InGaAs/AlGaAs lasers under high-power operation

Fukuda, Mitsuo; Okayasu, M.; Temmyo, Jiro; Nakand, J.

doi:10.1109/3.283796

Cited by 103 publications

(34 citation statements)

References 20 publications

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“…Sudden failure occurs when the COD level reaches the operating power level [18]. The facet degradation of InGaAs/GaAs strained-layer lasers has been analyzed with the OBIC technique.…”

Section: Facet Degradationmentioning

confidence: 99%

Failure Analysis Using Optical Evaluation Technique (OBIC) of LDs and APDs for Fiber Optical Communication

Takeshita

2012

Materials and Reliability Handbook for Semiconductor Optical and Electron Devices

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By employing the optical-beam-induced current (OBIC) measurement technique, we have analyzed the sudden and wear-out failure of optical devices. The extent of the degraded region is estimated by using relative OBIC intensity prior to aging. The use of OBIC incident sources at several wavelengths enables us to detect degradation in facets, epitaxial layers, and the device interior. IntroductionOptical-beam-induced current (OBIC) measurement [1][2][3][4], as well as other approaches such as electron-beam-induced current (EBIC) measurement [5] and luminescence measurement [6], can determine the existence of deterioration in optical and electronic devices. Of these approaches, the OBIC technique has the advantages of being nondestructive and capable of selecting wavelengths [7].First, since the OBIC is measured through the window of a transistor outline (TO) can before and after aging, we are able to detect an OBIC change for several periods of aging. When there are nonradiative recombination centers in the degraded region, the OBIC intensity decreases as the recombination density increases [8]. The relative OBIC intensity prior to aging is useful for analyzing the degree of device degradation. Furthermore, the incident light that illuminates the facet is absorbed in the semiconductor. However, the lights incident on the top surface rather than the facet are absorbed in the layer to a depth of not more than a few micrometer. The OBIC measurement technique that involves illuminating the facet is therefore expected to be highly susceptible to degradation.

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“…Sudden failure occurs when the COD level reaches the operating power level [18]. The facet degradation of InGaAs/GaAs strained-layer lasers has been analyzed with the OBIC technique.…”

Section: Facet Degradationmentioning

confidence: 99%

Failure Analysis Using Optical Evaluation Technique (OBIC) of LDs and APDs for Fiber Optical Communication

Takeshita

2012

Materials and Reliability Handbook for Semiconductor Optical and Electron Devices

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“…This mechanism has been known to cause catastrophic optical damage in InGaAs QW lasers through facet oxidation or defect formation under high-power operation [38][39][40][41] . To test this hypothesis, we wanted to examine if the rate of degradation would depend on the proximity of the InGaAs QW to the semiconductor-air interface.…”

Section: Dependence On Cap Thicknessmentioning

confidence: 99%

Degradation mechanism of SESAMs under intense ultrashort pulses in modelocked VECSELs

Addamane

Shima

Laurain

et al. 2018

Vertical External Cavity Surface Emitting Lasers (VECSELs) VIII

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“…Laser damage occurs long before power densities of this magnitude, due to nonradiative centers and catastrophic optical damage (COD) to the mirrors [34]. COD is attributed to large power densities on the facets of edge-emitting lasers.…”

Section: Single-mode Ridge and Multi-mode Broad-area Lasersmentioning

confidence: 99%

Finite aperture tapered unstable resonator lasers

Bedford¹

2003

Frontiers in Optics

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Degradation behavior of 0.98-μm strained quantum well InGaAs/AlGaAs lasers under high-power operation

Cited by 103 publications

References 20 publications

Failure Analysis Using Optical Evaluation Technique (OBIC) of LDs and APDs for Fiber Optical Communication

Failure Analysis Using Optical Evaluation Technique (OBIC) of LDs and APDs for Fiber Optical Communication

Degradation mechanism of SESAMs under intense ultrashort pulses in modelocked VECSELs

Finite aperture tapered unstable resonator lasers

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