Proceedings of the 2005 International Conference on Microelectronic Test Structures, 2005. ICMTS 2005.
DOI: 10.1109/icmts.2005.1452210
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Design and characterization of a post-processed copper heat sink for smart power drivers [lateral nDMOS drivers]

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Cited by 2 publications
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“…Zawischka et al [2] modifies the chip layout by reduced source contact density or separated gates. Another way is to lower the temperature rise within the active transistor by incorporation of a thick Cu layer on top of the power device [3].…”
Section: Introductionmentioning
confidence: 99%
“…Zawischka et al [2] modifies the chip layout by reduced source contact density or separated gates. Another way is to lower the temperature rise within the active transistor by incorporation of a thick Cu layer on top of the power device [3].…”
Section: Introductionmentioning
confidence: 99%