Extended Abstracts of the 2011 International Conference on Solid State Devices and Materials 2011
DOI: 10.7567/ssdm.2011.p-4-15l
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Design and Optimization of Program and Restore Operations in CMOS-Compatible Nonvolatile Latch

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Cited by 4 publications
(3 citation statements)
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“…The die micrograph is presented in Fig. 3 (a), where the die size is 950 μm × 515 μm, and a 32-bit 16-program-cycle NV-M with a 2-transistor memory cell utilizing a hot-electron trapping at the sidewall of memory transistor stores D FXC and D DAC [6]. Fig.…”
Section: Resultsmentioning
confidence: 99%
“…The die micrograph is presented in Fig. 3 (a), where the die size is 950 μm × 515 μm, and a 32-bit 16-program-cycle NV-M with a 2-transistor memory cell utilizing a hot-electron trapping at the sidewall of memory transistor stores D FXC and D DAC [6]. Fig.…”
Section: Resultsmentioning
confidence: 99%
“…In this paper, we present the principle, design, application and evaluation results of a prototype 32-bit 16-program-cycle NV-M for analog circuit calibration in a standard 0.18 µm CMOS [4].…”
Section: Introductionmentioning
confidence: 99%
“…Moreover, since the optimum value of V CTRL at the onset of the closed-loop operation is not V DD /2 but is susceptible to process variation of VCO varactors, this variation is individually calibrated through the optimization of the open-loop V CTRL with V CTRL setting code, D DAC , and a followed DAC to linearize the VCO operation. A 32-bit 16-program-cycle NV-M fabricated in a standard CMOS can provide these calibration data with the minimum fabrication cost overhead [5].…”
Section: Introductionmentioning
confidence: 99%