1991, Proceedings. International Test Conference
DOI: 10.1109/test.1991.519696
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Design for Testability Using Scanpath Techniques for Path-Delay Test and Measurement

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Cited by 135 publications
(49 citation statements)
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“…launch-off-shift [6], launch-offcapture [7], and enhanced scan [8]. In all three methods, a pattern pair (V1, V2) is applied to target delay faults but with different launch mechanisms.…”
Section: A Related Prior Workmentioning
confidence: 99%
“…launch-off-shift [6], launch-offcapture [7], and enhanced scan [8]. In all three methods, a pattern pair (V1, V2) is applied to target delay faults but with different launch mechanisms.…”
Section: A Related Prior Workmentioning
confidence: 99%
“…Enhanced scan element designs have been proposed for two-pattern delay testing [9]- [11]. The idea is to add an extra latch to the scan element so that both the and patterns can be stored and applied in succession.…”
Section: Test-pattern Generation For Three-pattern Testsmentioning
confidence: 99%
“…This is due to the fact that the second pattern of a two pattern test is correlated to the first pattern [2,3]. To achieve maximum delay fault coverage, enhanced scan which allows application of arbitrary two-pattern tests has been proposed [4]. However the relatively high area overhead of enhanced scan precludes its use in many designs.…”
Section: Introductionmentioning
confidence: 99%