Development of a roughness measurement standard with irregular surface topography for improving 3D surface texture measurement

Abstract

In this study, measurement standards with irregular surface topography which can be used for surface texture measuring instruments of various measurement principles are proposed, and the verification system for surface texture measuring instruments is established using the measurement standard. We have generated the software gauge data with 3D irregular surface texture using the non-causal 2D auto-regressive model (2D AR model). This model can generate periodic irregular surface topography data from specified surface texture parameters, and based on the generated software gauge data, the measurement standards were manufactured by machining with a diamond ball end mill. The short wavelength components which cannot be processed by the ball end mill were removed from the original machining data by the morphological filter. Manufactured measurement standards were measured using three types of surface texture measuring instruments. Proposed measurement standards can be used for various types of measuring instruments.

Calibration and verification of areal surface texture measuring instruments

“…For the overall calibration of surface topography instruments, areal irregular (type AIR) material measures have been developed by Nomento et al [136] and are currently mass produced using nickel replication (see Fig. 12 and [119]).…”

3-Dimensional profile distortion measured by stylus type surface profilometer

“…Wu [25] created a rough surface with Gaussian distortion, after which Wu [26], Cai et al [27] and Manesh [28] created a 3D surface with Non-Gaussian distortion characteristics. Uchidate [29,30] produced a 3D random topography dataset on the basis of a 2D autoregressive (AR) model. However, none of these methods have overcome the limit in expressing 3D shape information from an actual machined surface.…”

A methodology to predict the roughness of shot peened surfaces

“…Recently, there had been a drive towards three dimensional topographical characterization of surfaces with new standards defining area parameters such as S a and S t (Nemoto et al, 2009) which correspond to R a and R t respectively. These parameters can be measured with optical methods.…”