2013
DOI: 10.1016/j.solener.2013.09.021
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Development of n-μc-SiOx:H as cost effective back reflector and its application to thin film amorphous silicon solar cells

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Cited by 14 publications
(4 citation statements)
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“…In our previous work [11] authors have observed that, it is possible to increase the band gap upto 2.27 eV with a minimum obtained refractive index of 2.1 and further reduction in refractive index was not possible even after fine tuning of deposition parameters. So in the present work SiF 4 is added in order to reduce the refractive index further.…”
Section: Study On Variation Of Sifmentioning
confidence: 99%
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“…In our previous work [11] authors have observed that, it is possible to increase the band gap upto 2.27 eV with a minimum obtained refractive index of 2.1 and further reduction in refractive index was not possible even after fine tuning of deposition parameters. So in the present work SiF 4 is added in order to reduce the refractive index further.…”
Section: Study On Variation Of Sifmentioning
confidence: 99%
“…Recently we have reported development of n-mc-SiO:H material [11] by the PECVD technique (13.56 MHz) from a mixture of silane, carbon dioxide and hydrogen and applied it as back reflector to single junction a-Si solar cells having improved efficiency. The requirements of good BRL material is low refractive index along with high optical gap and high lateral electrical conductivity [6].…”
Section: Introductionmentioning
confidence: 99%
“…Out of different ways, the optical absorption and carrier collection can be increased by improving the reflection characteristics of a back reflector layer (BRL, a layer between the metal back contact and the bottom n-layer in an a-Si:H solar cell). This allows the incident light to have multiple numbers of bounces through the active layers, leading to an increase in the optical absorption of the device. …”
Section: Introductionmentioning
confidence: 99%
“…5,6,[19][20][21] On the other hand, n-type nanocrystalline SiO x :H (n-nc-SiO x :H) materials with a low refractive index close to that of ZnO:Al have recently been utilized to improve the p-i-n cell structure with n-nc-Si:H from p/i/n-nc-Si:H/ZnO:Al/Ag to the simple p/i/n-nc-SiO x :H/Ag. [22][23][24] To reduce further the optical loss at the back contact, we suggest the application of MgF 2 with an index (n ³ 1.38) lower than that of ZnO:Al (n ³ 2.0) at the n-µc-SiO x :H/Ag back interface, which has not been studied in thin-film silicon solar cells. In a field of a-Si:H/c-Si heterojunction-type cells, recently, MgF 2 of 300-400 nm thickness has been used between the ITO and the Ag back contact by using a fine-mesh shadow mask since it is not electrically conductive.…”
mentioning
confidence: 99%