Dielectric parameters of the modern low-loss ceramics in the microwave, millimeter, and submillimeter ranges.

Abstract

Moreover, this loss is only slightly higher, that in the corresponding single crystal (sapphire).The nature of observed losses is considered. The loss frequency dependencies in the MM and SubMM ranges in all ceramics Al 2 O 3 studied can be well described by RADIOELEKTRONIKI), ISSN 1684-1719, N2, 2018 2 the linear approximation. Such dependence corresponds to the mechanism of socalled one-phonon lattice loss induced by the crystal lattice disorder. JOURNAL OF RADIO ELECTRONICS (ZHURNAL

Measurement of dielectric loss at millimeter range in the low loss materials with arbitrary ratio of wavelength and sample thickness.

“…From the solution of equation 6the obtained value of dielectric loss in this material at this frequency at room temperature: tanδ = 3.110 4 . This value is close to the corresponding value in the aluminium oxide ceramics Al 2 O 3 of the brand VK100M produced by the Company "Plant Magneton" [5]. In addition, these values are close to the losses in the single crystal of Al 2 O 3 (sapphire).…”

“…In addition, these values are close to the losses in the single crystal of Al 2 O 3 (sapphire). It should also be noted that the relevant Chinese ceramics production losses are higher [5]. This indicates a very high quality of the modern Russian ceramics of aluminum oxide.…”

“…In many cases, the samples of low loss materials, particularly ceramics, have a thickness that is more than half of wavelength in the dielectric sample [3][4][5]. In this work the measurement technique is upgraded to measure the dielectric loss in the samples whose thickness is of the order or greater than a half of the wavelength in the material.…”