2018
DOI: 10.1007/s12633-018-0029-4
|View full text |Cite
|
Sign up to set email alerts
|

Down-Conversion Effect Created by SiOx Films Obtained by HFCVD and Applied over Pn-Junctions

Help me understand this report

Search citation statements

Order By: Relevance

Paper Sections

Select...
2
2
1

Citation Types

0
5
0

Year Published

2021
2021
2023
2023

Publication Types

Select...
5

Relationship

0
5

Authors

Journals

citations
Cited by 5 publications
(5 citation statements)
references
References 34 publications
0
5
0
Order By: Relevance
“…In addition, previous studies have shown that using a SiO x film as a top coating on silicon solar cells can improve the J-V curve and external quantum efficiency (EQE) values. In these cases, SiO x has been obtained by LPCVD and HFCVD, resulting in efficient photoluminescence and transmittance values [11,12].…”
Section: Introductionmentioning
confidence: 99%
“…In addition, previous studies have shown that using a SiO x film as a top coating on silicon solar cells can improve the J-V curve and external quantum efficiency (EQE) values. In these cases, SiO x has been obtained by LPCVD and HFCVD, resulting in efficient photoluminescence and transmittance values [11,12].…”
Section: Introductionmentioning
confidence: 99%
“…The first contribution is the dispersion of incident photons in areas not covered by gold contacts, interaction with photogenerated electrons [ 37 ], and the result of the charge-discharge process of Si-ncs [ 26 ], where the absorption of light (photon density) generates electron-hole pairs as a consequence of the discharge process from the Si-ncs, and a photocurrent is generated in the structure. Second, due to the nature of the SRO material, it shows interesting electrical properties, such as charge trapping and non-trapping; due to the defects mentioned in photoluminescence, these allowable electronic states placed within the wide band gap of the SRO material facilitate the photodetection of light signals in MIS-type structures, and moreover, induce the formation of P-N intrinsic regions [ 6 ] when it is reversely polarized. This creates a larger depletion space charge region that can absorb incident photons to create electron-hole pairs, thereby increasing the photocurrent [ 38 ].…”
Section: Discussionmentioning
confidence: 99%
“…Photons with this wavelength could be absorbed by the induced P-N junction formed at the interface between the SRO film and n-type silicon, as shown in Figure 20 . This property suggests that the Au/SRO/Si structure may be better suited to generate the “down-conversion” effect, which then contributes to the absorption of these photodetector devices [ 6 ]. The emission mechanism present in the PL spectra is related to some defects, such as neutral oxygen vacancies (NOV), weak oxygen bonds (WOB), non-bonded hollow oxygen centers (NBOHC), and positively charged oxygen vacancies [ 42 , 43 , 44 , 45 , 46 , 47 , 48 ].…”
Section: Discussionmentioning
confidence: 99%
See 1 more Smart Citation
“…[ 25,49 ] Another prospect for these Si‐compound thin films is their application to improve solar cell efficiency as antireflective or downshifting layers, which absorb UV radiation and re‐emit it in the visible region. [ 54 ] Recently, Si NPs have been tested in different structures to develop photovoltaic devices, such as n‐type Si QDs/p‐type c‐Si heterojunction, p‐type Si QDs/n‐type c‐Si heterojunction, and p– i –n diodes. [ 55,56 ] Efficiencies below 15% have been reported in structures of these types; however, the main limitation is still the difficulty of transferring the electric charge due to dielectric matrices.…”
Section: Embedding Qds and Nps In Thin‐film Matrices And Their Relati...mentioning
confidence: 99%