2009 74th ARFTG Microwave Measurement Conference 2009
DOI: 10.1109/arftg74.2009.5439093
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Duty cycle dependent pulsed IV simulation and thermal time constant model fitting for LDMOS transistors

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Cited by 3 publications
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“…The latter would be under a variable temperature at a significantly lower average. [6][7][8] Heat, which was generated at such a small length scale, is dissipated at larger length scales, going from chip to package, PCB and system levels. Evidently, this entails other much large time constants.…”
Section: Qualitative Estimates Of Thermal Time Constants At the Devicmentioning
confidence: 99%
“…The latter would be under a variable temperature at a significantly lower average. [6][7][8] Heat, which was generated at such a small length scale, is dissipated at larger length scales, going from chip to package, PCB and system levels. Evidently, this entails other much large time constants.…”
Section: Qualitative Estimates Of Thermal Time Constants At the Devicmentioning
confidence: 99%