Increasing process variations and tolerance limits such testing approaches quantify performance, fault-tolerant with successive scaling, along with rising costs per design cycle design will directly enhance reliability, by ensuring optimal have made the fault-tolerance paradigm pertinent in RFICs. circuit operation under varying conditions. Due to the high frequencies involved, traditional fault-tolerance Key criteria to such design are minimal intrusion, low methods used in digital and lower frequency analog circuits overheads and ultra-fast calibration. In prior work, we have cannot be applied. This paper presents a non-intrusive and p robust technique of self-calibrating the gain and output match proposed to use the HF supply current drawn by the RF of LNAs. It involves very low overheads and does not degrade , circuit performance in any measurable way, in addition to input-match of a LNA [5]. The gain of the LNA is a critical ultra-fast calibration times (lower than 50 ps). We present parameter to the front-end performance, since it impacts the simulation results of the system designed in the IBM 0.25 pm SNR. A drop in gain due to process variations or faults can process.lead to reduced receiver sensitivity, thus leading to loss of