Proceedings of the 31st European Solid-State Circuits Conference, 2005. ESSCIRC 2005.
DOI: 10.1109/esscir.2005.1541580
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Dynamic state-retention flipflop for fine-grained sleep-transistor scheme

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Cited by 4 publications
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“…Scan-based techniques, which are used for serially saving and restoring internal retention cells, also suffer from latency and energy overhead [8]. The State Retention Power Gating (SPRG) technique addresses the above-mentioned PG technique's limitations [9][10][11][12][13].…”
Section: Introductionmentioning
confidence: 99%
“…Scan-based techniques, which are used for serially saving and restoring internal retention cells, also suffer from latency and energy overhead [8]. The State Retention Power Gating (SPRG) technique addresses the above-mentioned PG technique's limitations [9][10][11][12][13].…”
Section: Introductionmentioning
confidence: 99%
“…It is reported that more than 40% of total power can be due to the leakage currents [1][2][3][4][5][6]. In an idle circuit, leakage is the main source of power consumption.…”
Section: Introductionmentioning
confidence: 99%
“…Henzler et al propose a dynamic state retention flip-flop using fine-grained sleep transistor scheme. But the retention time is in the range of milliseconds [4]. The selfdata retention flip-flop proposed by Seomun and Shin uses virtual power rail to control the operation.…”
Section: Introductionmentioning
confidence: 99%
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