2007
DOI: 10.1063/1.2430937
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Effect of annealing temperature and ambient gas on phosphorus doped p-type ZnO

Abstract: The authors report on the thermal activation of phosphorus doped p-type ZnO thin films grown by radio frequency magnetron sputtering. The p-type ZnO was produced by activating phosphorus doped ZnO thin films in N 2 , Ar, or O 2 ambients. The hole concentration of the p-type ZnO, prepared in an O 2 ambient, showed a lower hole concentration compared to samples annealed in N 2 and Ar ambients. The activation energies of the phosphorus dopant in the p-type ZnO under different ambient gases indicate that phosphoru… Show more

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Cited by 62 publications
(31 citation statements)
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“…The peaks located at 3.356 and 3.322 eV are attributed to A 0 X and FA transitions, respectively. Similar results were observed in P doped p-type ZnO thin film; the FA transition was observed at 3.320 eV [15,16]. Moreover, the peak at 3.236 eV is ascribed to donor-acceptor pair (DAP) transition.…”
Section: Methodssupporting
confidence: 85%
“…The peaks located at 3.356 and 3.322 eV are attributed to A 0 X and FA transitions, respectively. Similar results were observed in P doped p-type ZnO thin film; the FA transition was observed at 3.320 eV [15,16]. Moreover, the peak at 3.236 eV is ascribed to donor-acceptor pair (DAP) transition.…”
Section: Methodssupporting
confidence: 85%
“…It is strongly believed that the peak observed at 3.35 eV is due to the emission bound to the As acceptor. According to the report by Hwang et al [15] of p-doped ZnO film grown by RF sputtering, the peak at 3.35 eV was assigned as (A 0 X) emission. The dominant peak located at 3.20 eV, corresponds to DAP transition.…”
Section: Resultsmentioning
confidence: 99%
“…Many efforts have been made to produce p-type ZnO by using different acceptor agents such as P, As, Sb and Li [4][5][6][7][8][9]. But the result of a first-principle calculation predicts that the N element is the best candidate for producing the p-type ZnO due to small strain effects and shallow acceptor levels of substitution of N for O [2,3].…”
Section: Introductionmentioning
confidence: 97%