Steady-state measurements were made of the optical emission and electrical properties of amphoteric Si-doped GaAs diodes. The width of the emitting region of these diodes is explained in terms of a theory involving the drift of electrons across a semi-insulating p-region. At low currents radiative recombination occurs in the p-region within a diffusion length of the junction. However, at high currents a considerable number of injected electrons drift across the p-region and light emanates from the entire p-region. The theory is consistent with the observed I-V characteristics and also with the spreading of the emission into the p-region.