1983
DOI: 10.1088/0022-3727/16/12/013
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Electrical properties of Te-rich, Cd-rich and hydrogen-exposed polycrystalline CdTe thin films

Abstract: Polycrystalline films of CdTe, stoichiometric, Te-rich, and Cd-rich, were grown using a vacuum evaporation technique on glass substrates kept at room temperature. The as-grown films were exposed to hydrogen gas at high pressure (200-500 PSI). Measurements of DC conductivity in the temperature range 77-300K, X-ray diffraction studies and electron probe microanalyses were made on these films. The conductivity data for the stoichiometric, Te-rich and Cd-rich films in the low temperature region have been analysed … Show more

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Cited by 22 publications
(10 citation statements)
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“…The relationship of increasing %Te resulting in decreasing resistivity is also consistent with our previous results . In addition, this trend has been observed previously in p-CdTe electrodeposited thin films in which a similar inverse correlation between resistivity and deposition potential was correlated, , and a similar result on higher Te content giving lower resistivity of CdTe thin films was observed …”
Section: Resultssupporting
confidence: 92%
See 1 more Smart Citation
“…The relationship of increasing %Te resulting in decreasing resistivity is also consistent with our previous results . In addition, this trend has been observed previously in p-CdTe electrodeposited thin films in which a similar inverse correlation between resistivity and deposition potential was correlated, , and a similar result on higher Te content giving lower resistivity of CdTe thin films was observed …”
Section: Resultssupporting
confidence: 92%
“…21 In addition, this trend has been observed previously in p-CdTe electrodeposited thin films in which a similar inverse correlation between resistivity and deposition potential was correlated, 25,26 and a similar result on higher Te content giving lower resistivity of CdTe thin films was observed. 27 The I sd −V sd characteristics of a 64% Te-rich and a 75% Terich CdTe device are evaluated with gate voltage (V g ) set at V g = 0, V g = −40 V, and V g = 40 V (Figure 3A). When a V g of −40…”
Section: ■ Results and Discussionmentioning
confidence: 99%
“…The presently studied system belongs to the class of low-dimensional polycrystalline materials. Therefore, in addition to the increase of the free charge carrier concentrations due to internal photoelectric effect, also the photoinduced modulation of grain boundary barrier heights could be important in determining the overall dynamics of charge carrier transport through the films. The photomodulation of the intercrystalline boundary barriers in the presently studied n-type semiconductor is explained as follows. In the absence of photoexcitation by external light source, in n-type semiconductor with acceptor-type surface states, band bending on the surface occurs as a result of the spontaneous negative charge transfer from the bulk part of the semiconductor to the surface.…”
Section: Resultsmentioning
confidence: 99%
“…This suggests that direct band-to-band electronic transitions contribute to the internal photoelectrical effect in the presently studied thin films, which is in line with the conclusions about the band structure of AgBiS 2 thin films derived on the basis of the optical spectroscopy data given in our previous paper, 46 and also with the available literature data for this material. 50,51,[53][54][55][56][57] To quantitatively characterize the mentioned transitions, linear least-squares interpolations of the ((∆σ st. / ∆σ st.,max. ) × hν) 2 vs hν dependencies in the relevant energy range were carried out.…”
Section: Photoelectrical Properties 321 Stationary Photo-conductiwity...mentioning
confidence: 99%
“…Following Mott, , the VRH mechanism generates the following dependence of σ on T : where σ 0 and T 0 are constants. At relatively higher temperatures (usually above 250 K, , which depends on the Debye's length, i.e., the D / L D ratio), the predominant charge-transport mechanism involves thermionic emission over the crystal (grain) boundaries. In the case of studied, chemically deposited nanocrystalline SnSe thin films, the calculated Debye length (for a usual doping concentration of 10 23 m -3 and taking the average literature value for ε r in the case of SnSe of 15) is close to 15 nm.…”
Section: Resultsmentioning
confidence: 99%