Aluminum Zinc co-doped Tin Oxide (AZSO) thin film was grown by sol-gel spin
coating techniques onto a glass substrate using various doping
concentrations (0, 2, 4, 6, and 8 wt%) and the effect of doping on each
sample were studied using structural analysis; X-ray Diffraction (XRD)
pattern, gravimetric method; thin film thickness and UV photo-spectrometer;
optical properties. The results of the XRD were revealed that all the peaks
have a tetragonal phase of SnO2, which were oriented at the 110, 101, and
211 planes. The film thickness was observed to vary with doping
concentration. In the visible region, all the film samples were exhibited at
average transmittance. The coefficient of absorption was gradually increased
with an increase in photon energy at a certain level with a decrease in the
absorption coefficient as the photon energy increases further. At 550-800 nm
range of wavelength, a high extinction coefficient (k) was recorded and the
refractive index curves show regular dispersion behavior. The optical
conductivity of the films followed a similar pattern, which showed that
conductivity increased to a peak at 3.60 eV. The energy bandgap of the film
samples (AZSO1 - AZSO5) is 4.095 eV, 4.103 eV, 4.087 eV, 4.114 eV, and 4.106
eV, respectively. The studies show that the properties of Al-Zn co-doped
SnO2 films can be explored for optoelectronic applications.