2022
DOI: 10.1016/j.spmi.2021.107097
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Enhancement in optoelectronic properties of lanthanum co-doped CdO: Zn thin films for TCO applications

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Cited by 10 publications
(6 citation statements)
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“…The EQE of an optical device is the parameter that helps to analyze the efficiency of the photodetector in converting the incoming photonic signal into an electrical signal 59 . EQE‐ V plots were obtained (Figure 8D) using the parameters obtained from the I – V characteristics under UV light as a function of light intensity with the help of the following equation 63,82 : rmEQEbadbreak=false(IlightIdarkfalse)/qP/hv$$\begin{equation}{rm{EQE}} = \frac{( I_{\mathrm{light}} - I_{\mathrm{dark}})/q}{P /hv}\end{equation}$$where h is the Planck constant, and ν is the incident light frequency…”
Section: Resultsmentioning
confidence: 99%
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“…The EQE of an optical device is the parameter that helps to analyze the efficiency of the photodetector in converting the incoming photonic signal into an electrical signal 59 . EQE‐ V plots were obtained (Figure 8D) using the parameters obtained from the I – V characteristics under UV light as a function of light intensity with the help of the following equation 63,82 : rmEQEbadbreak=false(IlightIdarkfalse)/qP/hv$$\begin{equation}{rm{EQE}} = \frac{( I_{\mathrm{light}} - I_{\mathrm{dark}})/q}{P /hv}\end{equation}$$where h is the Planck constant, and ν is the incident light frequency…”
Section: Resultsmentioning
confidence: 99%
“…The EQE of an optical device is the parameter that helps to analyze the efficiency of the photodetector in converting the incoming photonic signal into an electrical signal. 59 EQE-V plots were obtained (Figure 8D) using the parameters obtained from the I-V characteristics under UV light as a function of light intensity with the help of the following equation 63,82 :…”
Section: Resultsmentioning
confidence: 99%
“…From the I-V measurements of the device in the dark, the ideality factor (n) and saturation current were determined as 2.9 and 6.08 × 10 −9 A, respectively, using thermionic emission method. Sarath Babu et al [42] obtained the ideality factor 3.4 for p-Si/CdO-Zn-La. Furthermore, Ismail et al [16] calculated as 3.6 for nanostructured CdO/Si heterojunction photodetector while it has been obtained as 3.2 for CdS nanoparticles sensitized CdO diode [27].…”
Section: Resultsmentioning
confidence: 99%
“…Accordingly, the device with a high R value will also have a high EQE value. Figure 7(b) depicts the EQE of the CdO:Se/p-Si heterojunction UV light photodetector using the relation EQE = R hc qλ [42]. Here, h, c, and λ are Planck's constant, the speed of light, and the wavelength of incident light, respectively.…”
Section: Resultsmentioning
confidence: 99%
“…However, this is not possible in practice. Hereby, based on the Ohm's law, Rs and Rsh can be determined from a graph of junction resistance (Rj= dV i /dI i ) against forward and reverse potentials [60]. From the Rj versus V graph, the Rsh and Rs values are determined from the values where the curves are almost constant at the maximum voltages under reverse and forward bias, respectively.…”
Section: Electrical Analysis Of the Ag/mnpc/gc/ag Photodiodementioning
confidence: 99%