2019
DOI: 10.1109/led.2019.2897734
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ESD-Reliability Enhancement of Circular UHV 300-V Power nLDMOS by the Drain-side Superjunction Structure

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Cited by 1 publication
(3 citation statements)
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“…The CBSLOP LDMOS was proposed to alleviate the SAD effect with a surface SJ layer [56] . The SJ layer provides a low resistance current path, which experimentally realized V B of 500 V and R on of 96 mΩ•cm 2 . Fig.…”
Section: Development Of the Structuresmentioning
confidence: 99%
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“…The CBSLOP LDMOS was proposed to alleviate the SAD effect with a surface SJ layer [56] . The SJ layer provides a low resistance current path, which experimentally realized V B of 500 V and R on of 96 mΩ•cm 2 . Fig.…”
Section: Development Of the Structuresmentioning
confidence: 99%
“…The best trade-off between R on and V B is realized by the optimization of the proper doping concentration and structure of the VSL. For the power MOSFET, the R on and V B relationship satisfies the "silicon limit" of R on ∝V B 2.5 [2] . To alleviate this contradiction, Chen X B proposed several methods to introduce the high electric field in the bulk of the device, including a new structure called SJ now [3][4][5] , as shown in Fig.…”
Section: Introductionmentioning
confidence: 99%
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