IEEE Antennas and Propagation Society International Symposium. Transmitting Waves of Progress to the Next Millennium. 2000 Dige
DOI: 10.1109/aps.2000.874889
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Experimental study and modeling of microwave bond wire interconnects

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Cited by 4 publications
(2 citation statements)
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“…The CMOS substrate was simulated to estimate the parasitics of the PAD, substrate effect, and metal line loss. The equivalent circuit of the bondwire is extracted as a π-model [32]. The traces by EM and bondwires in π-model are then co-simulated by ADS circuit simulator to evaluate the overall inductance and Q.…”
Section: A Wafer-level Bslmentioning
confidence: 99%
“…The CMOS substrate was simulated to estimate the parasitics of the PAD, substrate effect, and metal line loss. The equivalent circuit of the bondwire is extracted as a π-model [32]. The traces by EM and bondwires in π-model are then co-simulated by ADS circuit simulator to evaluate the overall inductance and Q.…”
Section: A Wafer-level Bslmentioning
confidence: 99%
“…The length of the wire-bond is approximately 40 mil. The estimated loss of 40 mil ball crescent bond wires incorporated in the module at 14 GHz is 2 dB [11]. The filter ground planes were properly connected to the ground pads on the surface layers and are wire-bonded to the ground pads on the MMICs.…”
Section: Ltcc-based Module Design and Measuredmentioning
confidence: 99%