2009 IEEE International Symposium on Electromagnetic Compatibility 2009
DOI: 10.1109/isemc.2009.5284625
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Full wave model for simulating a Noiseken ESD generator

Abstract: A CST Microwave Studio model was generated to simulate the discharge current and the transient fi eld of an ESD generator. The ESD generator is conforming to the IEC 61000-4-2 standard. Individual components of the Noiseken ESD generator (ESS-2000) were modelled, validated and combined. The complete full wave model was verifi ed by comparing the simulated discharge current waveform and induced loop voltage with the measured results.

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Cited by 16 publications
(2 citation statements)
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“…To increase the robustness of the products against injected ESD noise, different experimental and full-wave numerical modeling techniques for system level ESD coupling analysis have been proposed in the literature. These include: failure analysis using susceptibility testing [5]; analysis of coupled ESD noise to DUT through time and frequency domain measurements [1,[10][11][12][13][14]; and full-wave EM simulation of DUT and ESD source [2,6,[15][16][17][18]. These reported techniques have limitations in terms of the requirement of the manufacturing of the DUT to perform susceptibility analysis [5], or the characterization of the coupled noise at victim positions for each different design configuration of the DUT [10][11][12][13][14]19].…”
Section: Introductionmentioning
confidence: 99%
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“…To increase the robustness of the products against injected ESD noise, different experimental and full-wave numerical modeling techniques for system level ESD coupling analysis have been proposed in the literature. These include: failure analysis using susceptibility testing [5]; analysis of coupled ESD noise to DUT through time and frequency domain measurements [1,[10][11][12][13][14]; and full-wave EM simulation of DUT and ESD source [2,6,[15][16][17][18]. These reported techniques have limitations in terms of the requirement of the manufacturing of the DUT to perform susceptibility analysis [5], or the characterization of the coupled noise at victim positions for each different design configuration of the DUT [10][11][12][13][14]19].…”
Section: Introductionmentioning
confidence: 99%
“…The ESD analysis using full-wave EM simulation provides more insight into the ESD noise coupling paths across multiple layers unlike [5], and thus making it more appropriate for the fast and efficient analysis of ESD coupling to DUT, compared to only experimental techniques [1,5,6,[10][11][12][13][14]. The existing studies related to ESD coupling analysis using full-wave numerical modeling, are either for a simple transmission line, circular loop and mobile phone-based DUT s [16][17][18]21] or lacks in the methodology for the systematic assessment of the sensitive traces for a realistic complete high-speed memory module.…”
Section: Introductionmentioning
confidence: 99%