2011 7th Conference on Ph.D. Research in Microelectronics and Electronics 2011
DOI: 10.1109/prime.2011.5966238
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Geometrical parameters influence on the Hall effect sensors offset and drift

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Cited by 22 publications
(29 citation statements)
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“…Using an automated measurement setup presented in detail by the authors in a recent paper [6], the proposed Hall cells have been tested and subsequently evaluated. In this sense eleven samples, each one containing 64 cells (the first eight different geometries in Table 1 times eight locations), were tested.…”
Section: Room Temperature Offset Measurement Results Using An Automatmentioning
confidence: 99%
See 2 more Smart Citations
“…Using an automated measurement setup presented in detail by the authors in a recent paper [6], the proposed Hall cells have been tested and subsequently evaluated. In this sense eleven samples, each one containing 64 cells (the first eight different geometries in Table 1 times eight locations), were tested.…”
Section: Room Temperature Offset Measurement Results Using An Automatmentioning
confidence: 99%
“…In order to accurately test the Hall Effect sensors, an automated measurements setup has been built [6]. Previous papers in the literature were devoted to Hall sensors current measurements [10].…”
Section: Hall Effect Sensor Measurementsmentioning
confidence: 99%
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“…where n and d are the doping concentration and the thickness of the n-well respectively, G is a geometrical correction factor and s H is the scattering factor of silicon usually 1.15 [7]. Reducing the thickness d of the Hall cell, not only a higher V H is obtained but also a lower cross-talk effect respect to the other magnetic field directions.…”
Section: Hall Cells Designmentioning
confidence: 99%
“…Various designs for CMOS Hall devices were proposed and their behavior tested in [11][12]. Low magnetic-equivalent residual offset (less than 30 mT at room temperature) and offset temperature drift (less than 7 0.3 mT/1C) values were obtained with specific Hall devices structures, such as the XL device [13].…”
Section: Introductionmentioning
confidence: 99%