Epitaxial layers of ruthenium-doped InP grown by low-pressure hydride vapor phase epitaxy have been studied. Current voltage measurements were conducted at temperatures between 20 and 200°C for samples doped with Ru in the range 1 ϫ 10 17 to 5 ϫ 10 17 cm Ϫ3 . In this doping range, the specific resistivity of n ϩ /InP:Ru/n ϩ structures accommodating electron injection is р1 ϫ 10 4 ⍀ cm and that of p ϩ /InP:Ru/p ϩ structures accommodating hole injection is as high as 3 ϫ 10 10 ⍀ cm. The reason for such a huge difference in the resistivity of these structures is attributed to a low activation of deep Ru acceptors, thus rather giving rise to an n Ϫ layer than a semi-insulating layer, as supported by our theoretical simulation. Analysis of the Arrhenius plots constructed from the temperature-dependent I-V curves yield an average activation energy of Ru with reference to the conduction band equal to 0.44 and 0.52 eV under electron and hole injection, respectively.Today, a key issue in the fabrication of high speed optoelectronic devices is semi-insulating ͑SI͒ materials utilized for current blocking, electrical isolation, and reduction of parasitics. The most widely used dopant for obtaining highly resistive InP is iron, a deep acceptor, which compensates the shallow donors. However, when InP:Fe and p-InP are adjacent to each other, the main drawback due to Fe is the interdiffusion of Fe and p-dopants. 1 This is mostly apparent in the SI buried heterostructure lasers in which a regrown InP:Fe is adjacent to p-InP:Zn, and therefore, a redistribution of dopants can essentially degrade the device operation. 2 Yet another issue is the poor current blocking behavior of InP:Fe under hole injection. An attractive alternative dopant would be the thermally very stable transition metal ruthenium, which has been recently investigated by Dadgar and co-workers. 3-5 Ruthenium has been shown to be stable as regards the above-mentioned interdiffusion with p-type dopants and to introduce several deep levels suitable for compensating electrons and holes. 3 Especially for the realization of buried heterostructure lasers having very high frequency modulation bandwidth the hydride vapor phase epitaxy ͑HVPE͒ technique is suitable, owing to its inherent strength in selective regrowth of very thick SI-InP ͑у5 m͒ layers. 6 In this paper, we present the electrical characteristics of the InP:Ru grown by HVPE. 7 Temperature-dependent currentvoltage ͑I-V͒ measurements are taken under the conditions of electron and hole injection and the activation energies are derived. We also show that the qualitative difference in magnitude of the resistivity obtained under electron and hole injection in our structures is in conformity with the theoretically predicted results.Three types of samples were investigated: n ϩ /SI/n ϩ for electron injection, p ϩ /SI/p ϩ for hole injection, and n ϩ /SI/p ϩ for double injection. The growth was carried out in a commercial Aixtron lowpressure HVPE ͑LP-HVPE͒ reactor in an ambient of N 2 , and the total reactor pressure was...