Highly accurate quasi-static modeling of microstrip lines over lossy substrates

Tuncer, E.; Neikirk, Dean P.

doi:10.1109/75.160123

Cited by 35 publications

(13 citation statements)

References 8 publications

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“…where is the complete elliptic integral of the first kind, and is the argument of the integral, expressed in terms of the CPW dimensions as (5) The ratio of elliptic integrals in (4) can be obtained by computation or approximated by the following expressions [18]: (6) While we found the above approximate expressions of (3)-(6) sufficiently accurate for our application, there are other proposed expressions for CPW's with finite-extent ground planes available in the literature [19], [20]. Also, simpler expressions are often found which use only the two parameters and [6], [16].…”

Section: Quasi-tem Modelmentioning

confidence: 99%

Characterization of broad-band transmission for coplanar waveguides on CMOS silicon substrates

Milanović

Ozgur

DeGroot

et al. 1998

IEEE Trans. Microwave Theory Techn.

102

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This paper presents characteristics of microwave transmission in coplanar waveguides (CPW's) on silicon (Si) substrates fabricated through commercial CMOS foundries. Due to the CMOS fabrication, the metal strips of the CPW are encapsulated in thin films of Si dioxide. Many test sets were fabricated with different line dimensions, all on p-type substrates with resistivities in the range from 0.4 1cm to 12.5 1cm. Propagation constant and characteristic impedance measurements were performed at frequencies from 0.1 to 40 GHz, using a vector-network analyzer and the through-reflect-line (TRL) deembeding technique. A quasi-TEM equivalent circuit model was developed from the available process parameters, which accounts for the effects of the electromagnetic fields in the CPW structure over a broad frequency range. The analysis was based on the conformal mapping of the CPW multilayer dielectric cross section to obtain accurate circuit representation for the effects of the transverse fields.

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Section: Quasi-tem Modelmentioning

confidence: 99%

Characterization of broad-band transmission for coplanar waveguides on CMOS silicon substrates

Milanović

Ozgur

DeGroot

et al. 1998

IEEE Trans. Microwave Theory Techn.

102

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“…The surface impedance Z S n of the n th triangular section can then be found by applying transverse resonance and non-uniform transmission line analysis [15][16][17], yielding…”

Section: Scaled Conductivity Surface Impedance Andmentioning

confidence: 99%

Quasi-static conductor loss calculations in transmission lines using a new conformal mapping technique

Tuncer

Lee

Islam

et al. 1994

IEEE Trans. Microwave Theory Techn.

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A new approximation technique to find the total series impedance per unit length for quasi-TEM transmission limes including conductor loss has been developed. It is shown through the use of conformal mapping that both frequency dependent skin-depth and proximity effects can be accurately modeled. Comparison between experimental measurements and calculations for twin-lead, coplanar strips, parallel square bars, and coplanar waveguide all show excellent agreement. This technique is easily generalized to any transmission line making use of polygonal cross-section conductors.

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“…For a triangular section, the surface impedance expression can be found by applying transverse resonance and non-uniform transmission line analysis [4,5]. The total input impedance for a triangular "transmission line" with width w n (at the "input" end, or front surface), "plate" separation of one unit distance, and length h n , filled with a uniform conducting material of conductivity σ, assuming an open circuit termination, is…”

mentioning

confidence: 99%

Efficient calculation of surface impedance for rectangular conductors

Tuncer

Neikirk

1993

Electron. Lett. (UK)

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We have developed a new expression for the frequency-dependent surface impedance of a rectangular bar that is easily used, and is numerically efficient. By dividing the metal bar into rectangular and square sections, skin depth-induced current crowding to the surfaces and corners can be accurately modeled. Comparison to measured data shows excellent agreement over a wide frequency range, covering the transition from dc-like behavior to skin-depth limited behavior.

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Highly accurate quasi-static modeling of microstrip lines over lossy substrates

Cited by 35 publications

References 8 publications

Characterization of broad-band transmission for coplanar waveguides on CMOS silicon substrates

Characterization of broad-band transmission for coplanar waveguides on CMOS silicon substrates

Quasi-static conductor loss calculations in transmission lines using a new conformal mapping technique

Efficient calculation of surface impedance for rectangular conductors

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