Metal organic chemical vapor phase epitaxy-grown ZnO layers using iso-propanol and DMZn as oxygen and zinc precursors, respectively, are presented. The layers were grown on GaN templates in the temperature range 400-475 C at a reactor pressure of 300-500 mbar with VI/II ratios around 45. A columnar structure with an average column size of 6.5 mm in diameter and a roughness of 70 nm (r.m.s.) is observed by atomic force microscopy measurements. In X-ray diffractometry reciprocal space maps the ZnO peak splits up indicating differently strained layers. An approximately 100 nm wide distorted transition region between the GaN and ZnO layers is found in these measurements. The low-temperature cathodoluminescence spectra are dominated by narrow nearband-edge emission and almost no deep defect-related luminescence is found. A pronounced spectral blue shift is found in the growth direction, which is attributed to the relaxation of the tensile stress and associated with inner fields. A strong microscopic correlation between the surface morphology and the emission of the acceptor bound excitons is observed.