1987
DOI: 10.1007/bf00615975
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Hydrogen in crystalline semiconductors

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Cited by 952 publications
(241 citation statements)
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“…Because of the high mobility and reactivity of hydrogen, a progressive aggregation with irradiation-induced defects occurs even at RT. 55 Hydrogen is known to modify the electrical properties of point defects and ultimately, full passivation may occur. By means of DLTS, it is possible to follow the evolution of these phenomena, e.g., the transformation of VO to VOH.…”
Section: B Vo Centermentioning
confidence: 99%
“…Because of the high mobility and reactivity of hydrogen, a progressive aggregation with irradiation-induced defects occurs even at RT. 55 Hydrogen is known to modify the electrical properties of point defects and ultimately, full passivation may occur. By means of DLTS, it is possible to follow the evolution of these phenomena, e.g., the transformation of VO to VOH.…”
Section: B Vo Centermentioning
confidence: 99%
“…On the other hand, hydrogen is stable in its positive charge state in p-type silicon and in a neutral or negative charge state in n-type silicon. 13 Since the STDH formation rate in p-type silicon is found to be higher than in n-type silicon, it is reasonable to speculate that the C i O i complex prefers to take the negative charge state. Moreover, a possible role of the introduction rate of hydrogen during the plasma exposure in the STDH formation rate cannot be ruled out.…”
mentioning
confidence: 99%
“…Standard semiconductor processing, such as mechanical polishing, HF etching, plasma treatments etc, can result in far higher levels of hydrogen close to the surface 215 . Several studies have found values as high as 10 18 molecules per cubic centimetre and drops significantly after a depth of one micron 225 .…”
Section: Hydrogenmentioning
confidence: 99%