Imaging of ferroelectric thin films by X-ray photoemission electron microscopy (XPEEM)

Lev, U.; Heun, S.; Locatelli, Andrea; Zolotoyabko, E.

doi:10.1016/j.ultramic.2005.03.008

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“…Early examples of PEEM applied to ferroelectrics studied adsorbate induced variations in the electron affinity. 15,16 Full field electron microscopy, covering PEEM, LEEM and Mirror Electron Microscopy (MEM), has recently started to provide interesting data on FE surfaces. As a result, it appears opportune to review the physics which can be revealed by the use of these techniques.…”

Section: Introductionmentioning

confidence: 99%

Full field electron spectromicroscopy applied to ferroelectric materials

Barrett¹,

Rault²,

Wang

et al. 2013

Journal of Applied Physics

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Section: Introductionmentioning

confidence: 99%

Full field electron spectromicroscopy applied to ferroelectric materials

Barrett¹,

Rault²,

Wang

et al. 2013

Journal of Applied Physics

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Combined X-ray-electron imaging techniques: Limitations on lateral resolution

Bakaleynikov

Flegontova

Zolotoyabko

2006

Journal of Electron Spectroscopy and Related Phenomena

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Imaging of ferroelectric films under an applied electric field by scanning electron microscopy

Lev

Zolotoyabko

2006

Journal of Applied Physics

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We report on scanning electron microscopy ͑SEM͒ measurements under external electric fields as a tool for studying electric-field-induced processes in ferroelectric thin films. Epitaxial films of BaTiO 3 , grown by metal-organic chemical-vapor deposition on MgO substrates, served as samples in this research. Electric fields of up to 6 MV/ m were applied to interdigital electrodes having 5 m blank intervals between metallic strips deposited on the top of the films. In situ SEM measurements under applied electric fields revealed time-dependent variations in contrast, attributed to domain rearrangements. The results obtained are analyzed in terms of nucleation and growth of energetically favorable domains. The critical electric field of about 10 MV/ m for the 90°-domain flips deduced from these measurements is in agreement with previously published data.

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Imaging of ferroelectric thin films by X-ray photoemission electron microscopy (XPEEM)

Cited by 3 publications

References 19 publications

Full field electron spectromicroscopy applied to ferroelectric materials

Full field electron spectromicroscopy applied to ferroelectric materials

Combined X-ray-electron imaging techniques: Limitations on lateral resolution

Imaging of ferroelectric films under an applied electric field by scanning electron microscopy

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