2019
DOI: 10.1038/s41467-019-11487-0
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InSe as a case between 3D and 2D layered crystals for excitons

Abstract: InSe is a promising material in many aspects where the role of excitons is decisive. Here we report the sequential appearance in its luminescence of the exciton, the biexciton, and the P-band of the exciton-exciton scattering while the excitation power increases. The strict energy and momentum conservation rules of the P-band are used to reexamine the exciton binding energy. The new value ≥20 meV is markedly higher than the currently accepted one (14 meV), being however well consistent with the robustness of t… Show more

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Cited by 46 publications
(53 citation statements)
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“…The highest-energy peak observed in the PL spectrum at T = 11 K is detected at ~1.307 eV. This is more than 30 meV lower than the exciton recombination line (1.338 eV) recently reported by Shubina et al [ 94 ] for flakes freshly cleaved from high structural quality bulk InSe grown by the Bridgman–Stockbarger method. According to the previous results [ 95 , 96 ], in the region below 1.32 eV, three main broad bands around 1.31, 1.28, and 1.23 eV have been reported in undoped InSe, which were assigned to impurity-band, donor–acceptor pair, and impurity-vacancy complex transitions, respectively.…”
Section: Resultsmentioning
confidence: 54%
“…The highest-energy peak observed in the PL spectrum at T = 11 K is detected at ~1.307 eV. This is more than 30 meV lower than the exciton recombination line (1.338 eV) recently reported by Shubina et al [ 94 ] for flakes freshly cleaved from high structural quality bulk InSe grown by the Bridgman–Stockbarger method. According to the previous results [ 95 , 96 ], in the region below 1.32 eV, three main broad bands around 1.31, 1.28, and 1.23 eV have been reported in undoped InSe, which were assigned to impurity-band, donor–acceptor pair, and impurity-vacancy complex transitions, respectively.…”
Section: Resultsmentioning
confidence: 54%
“…3b). The PL peak energy corresponds to that of the band-edge exciton 21,22 and is very sensitive to the layer thickness: it increases from E X~1 .28 eV for t = 19 layers to E X~1 .39 eV for t = 8 layers. Figure 3c shows the I-V SD and G-V SD curves of these three devices, revealing that the current and voltage spacing between consecutive resonances increases with decreasing t. We note that no resonances were observed in the device with t = 19 layers or in other devices with thicker layers.…”
Section: Resultsmentioning
confidence: 99%
“…These spectra were gathered 5 months after the initial exposure to the Kaufman source. The multiple emission lines at low photon energies (<1.32 eV) are most prominent at low excitation powers and are associated with impurities and/or defects [41,42]. No features at photon energies less than 1.32 eV can be successfully attributed to hydrogen, as the variation between the two samples is indistinguishable from the variation found within the individual samples.…”
Section: Photoluminescencementioning
confidence: 92%
“…No features at photon energies less than 1.32 eV can be successfully attributed to hydrogen, as the variation between the two samples is indistinguishable from the variation found within the individual samples. For photon energies above 1.32 eV, the exciton (X), biexciton (XX) and exciton-exciton scattering (X-X) PL lines can be identified [41,42]. They dominate the PL spectra at high excitation powers.…”
Section: Photoluminescencementioning
confidence: 99%