2015
DOI: 10.1109/temc.2015.2406664
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Integrated Circuit Modeling for Noise Susceptibility Prediction in Communication Networks

Abstract: This paper addresses an integrated circuit (IC) modeling procedure for mixed-signal immunity simulations of communication networks. The procedure is based on a gray-box approach, modeling (IC) ports with a physical circuit and the internal links with a behavioral block. The parameters are estimated from time and frequency domain measurements, allowing accurate and efficient reproduction of nonlinear device switching behaviors. The effectiveness of the modeling process is verified by applying the proposed techn… Show more

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Cited by 14 publications
(4 citation statements)
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“…It showed great accuracy in measuring EMI‐induced error‐propagation jitters. In [34], RF immunity simulation was performed to predict the CAN behaviour under EMI and facilitate the network immunity analysis.…”
Section: Requirements Of Tomorrow's Vehicles and Related Work About Cmentioning
confidence: 99%
“…It showed great accuracy in measuring EMI‐induced error‐propagation jitters. In [34], RF immunity simulation was performed to predict the CAN behaviour under EMI and facilitate the network immunity analysis.…”
Section: Requirements Of Tomorrow's Vehicles and Related Work About Cmentioning
confidence: 99%
“…The block parameters, such as comparator voltage threshold and internal propagation delay, have to be assessed from IC switching and DPI measurements in time domain. For further details about the AMS modeling procedure and the parameter estimation, the reader is referred to [6] and reference therein.…”
Section: A Can Transceivermentioning
confidence: 99%
“…In this contribution the Analog-Mixed Signal transceiver model presented in [6] is used together with a cable model to predict the behaviour of a real CAN network and to assess its performance in a noisy environment. Analog and digital waveforms measured along the network during a noise injection test are predicted accurately in time domain and the resulting immunity graph is built in a simulation environment.…”
Section: Introductionmentioning
confidence: 99%
“…Recently, simulation-based disturbance immunity testing methods have been proposed to overcome the drawbacks of measurement-based tests. To predict the IC-level immunity of DUTs, such as ICs and automotive components, both the noise source and the DUTs themselves have been modeled using equivalent circuit models and applied to immunity evaluation tests [10][11][12][13][14][15][16]. In system-level simulation-based immunity testing, three-dimensional (3D) models of the measurement setup and testing environment have been employed with electromagnetic field analyses and circuit simulation [15][16][17].…”
Section: Introductionmentioning
confidence: 99%