2011
DOI: 10.1103/physrevb.84.075411
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Interface of a Bi(001) film onSi(111)7×7imaged by surface x-ray diffraction

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Cited by 27 publications
(14 citation statements)
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“…According to the recent surface x-ray diffraction measurement, Bi film grown on Si(111) surface can contain two different domains in which the stacking of the Bi film having three fold symmetry is 180 • rotated to each other [21]. The variation of the out-of-spin component in different Bi film can probably be attributed to the different ratio of the two domains since the photoemission mea- surement gives the averaged information from the sample surface illuminated by the excitation light with finite spot size(∼ ϕ5 mm in the present measurement).…”
Section: Resultsmentioning
confidence: 99%
“…According to the recent surface x-ray diffraction measurement, Bi film grown on Si(111) surface can contain two different domains in which the stacking of the Bi film having three fold symmetry is 180 • rotated to each other [21]. The variation of the out-of-spin component in different Bi film can probably be attributed to the different ratio of the two domains since the photoemission mea- surement gives the averaged information from the sample surface illuminated by the excitation light with finite spot size(∼ ϕ5 mm in the present measurement).…”
Section: Resultsmentioning
confidence: 99%
“…3(b). According to the scanning tunneling microscopy and electron-diffraction experiments [12,13], the coupling between the Bi film and the Si(1 1 1) substrate is fairly weak owing to the aforementioned disordered wetting layer at the interface, suggesting the nearly freestanding nature of the Bi film [17]. The interface between Bi and Si can be regarded as "bottom surface" (Si-side) where the Rashba states similar to those at the normal surface (vacuumside) would emerge due to the breaking of the space-inversion symmetry at the interface.…”
Section: Discussionmentioning
confidence: 99%
“…It is possible to fabricate the Bi thin film by an epitaxial growth on the Si (1 1 1 called "wetting-layer" between Bi and Si substrate [12,13]. On the wetting layer, Bi thin film grows with a unit of puckered bilayer (BL) as shown in Fig.…”
Section: Methodsmentioning
confidence: 99%
“…[ 139 ] It is worth mentioning that, among these, the studies by Walker et al [ 128 ] and Tweet et al [ 140 ] were among the first to use anomalous CTR scattering to identify the energy‐dependent scattering from specific surface species as a means to extract atomic positions in an interfacial system. Recently, Shirasawa and colleagues have studied in situ grown heterostructures of Bi, [ 141 ] Bi/Bi 2 Te 3 , and Cu‐doped Bi 2 Te 3 on Si (111) by CTR scattering. [ 84,85,141 ] These structures are variants of topological insulators, which are a class of materials that have generated much interest due to their symmetry‐protected surface states and other unique electronic properties.…”
Section: Applicationsmentioning
confidence: 99%
“…Recently, Shirasawa and colleagues have studied in situ grown heterostructures of Bi, [ 141 ] Bi/Bi 2 Te 3 , and Cu‐doped Bi 2 Te 3 on Si (111) by CTR scattering. [ 84,85,141 ] These structures are variants of topological insulators, which are a class of materials that have generated much interest due to their symmetry‐protected surface states and other unique electronic properties.…”
Section: Applicationsmentioning
confidence: 99%