2004
DOI: 10.1016/j.mejo.2004.06.003
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Investigation of the novel attributes of a single-halo double gate SOI MOSFET: 2D simulation study

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Cited by 48 publications
(19 citation statements)
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“…It is clearly seen from the figure that the additional drain voltage is not absorbed on the source side of LDC-CNTFET structure. In other words, the p-doped region is screened from drain potential variations [25]. When the p-doped region is distributed linearly along the channel utilizing the LDC-CNTFET structure, the drain voltage has smaller effects on the channel region and screening the channel region at source side is more noticeable than SH-CNTFET structure.…”
Section: Simulation Results and Discussionmentioning
confidence: 99%
“…It is clearly seen from the figure that the additional drain voltage is not absorbed on the source side of LDC-CNTFET structure. In other words, the p-doped region is screened from drain potential variations [25]. When the p-doped region is distributed linearly along the channel utilizing the LDC-CNTFET structure, the drain voltage has smaller effects on the channel region and screening the channel region at source side is more noticeable than SH-CNTFET structure.…”
Section: Simulation Results and Discussionmentioning
confidence: 99%
“…halo or pocket implants. Single halo MOSFET structures have been introduced for bulk as well as for SOI MOSFETs [16][17][18] to adjust the threshold voltage and to improve the device SCEs.…”
Section: Introductionmentioning
confidence: 99%
“…However, for channel lengths below 100 nm, DG MOSFETs shows considerable SCEs. To overcome this, channel-engineering technique employs a single halo or lateral asymmetric channel is used, which shows a considerable reduction of SCEs [7]. On the other hand, a DM-DG SOI MOSFETs proposed by Reddy et al [8] employs gate-material engineering to reduce SCEs as compared with the DG SOI MOSFET.…”
Section: Introductionmentioning
confidence: 99%