Lattice guiding for sputter deposition of single domain (Sr_0.6Ba_0.4)Nb₂O₆ferroelectric thin films

Abstract

Lattice guiding is used to synthesize preferentially oriented thin films of (Sr 0.6 Ba 0.4 )Nb 2 O 6 by RF magnetron sputtering, with the film-substrate crystallographic relationship determined. These ferroelectric thin films guide light at 532 and 633 nm and have a single domain structure that can be written with permanent, submicron, anti-parallel domains.

Strain Engineered CaBi2Nb2O9 Thin Films with Enhanced Electrical Properties

“…The static dielectric constant can be obtained from the ε r −V curves under zero bias (∼280). The value of dynamic dielectric constant ε dy of the CBNO film is estimated to be in the range of [4,30]. 51 On the basis of the fitted value of b (see Figure 8) and measured/estimated dielectric constants, a space-charge density N eff in the range of [3.5 × 10 19 cm −3 , 2.0 × 10 20 cm −3 ] was estimated for the CBNO films.…”

“…Despite these significant improvements on the properties of CBNO films, there have been very few investigations focusing on enhancing their electrical performance via strain engineering, which has been broadly adopted in the design and preparation of perovskite ferroelectric thin films. This method utilizes the misfit strain imposed by an underlying substrate or a buffer layer to select grain orientation of a polycrystalline film, , or to enhance electrical properties of a single-domain epitaxial film . Moreover, this method can also be used to design domain architectures in a polydomain epitaxial film .…”

Dual harmonic Kelvin probe force microscopy for surface potential measurements of ferroelectrics

“…Epitaxial bismuth ferrite (BFO) films (200 nm thickness) were deposited by pulsed laser deposition on SrRuO 3 -coated (50 nm thickness) (001)-oriented SrTiO 3 substrates [19]. Lattice guiding and RF magnetron sputtering were used to synthesize single domain strontium barium niobate (SBN) films [20]. Poling of the ferroelectric films was performed by scanning an area of the sample with a DC biased conductive tip in contact with the surface.…”