Liquid metal ion sources: Mechanism and applications

Swanson, L. W.

doi:10.1016/0167-5087(83)91005-0

Cited by 108 publications

(54 citation statements)

References 12 publications

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“…The high currents of atomic ions generated by liquid metal ion sources are explained by an ion evaporation mechanism (15). In a liquid metal ion source, a high voltage is applied to a liquid metal in a nozzle until a Taylor Cone forms.…”

Section: Figmentioning

confidence: 99%

Principles of Electrospray Ionization

Wilm

2011

Molecular & Cellular Proteomics

229

104

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Electrospray ionization is today the most widely used ionization technique in chemical and biochemical analysis. Interfaced with a mass spectrometer it allows the investigation of the molecular composition of liquid samples. With electrospray a large variety of chemical substances can be ionized. There is no limitation in mass which thus enables even the investigation of large noncovalent protein complexes. Its high ionization efficiency profoundly changed biomolecular sciences because proteins can be identified and quantified on trace amounts in a high throughput fashion. This review article focuses mainly on the exploration of the underlying ionization mechanism. Some ionization characteristics are discussed that are related to this mechanism. Typical spectra of peptides, proteins, and noncovalent complexes are shown and the quantitative character of spectra is highlighted. Finally the possibilities and limitations in measuring the association constant of bivalent noncovalent complexes are described.

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Section: Figmentioning

confidence: 99%

Principles of Electrospray Ionization

Wilm

2011

Molecular & Cellular Proteomics

229

104

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“…[2][3][4] In the 1980s, FIB instruments were embraced by the semiconductor industry as offline equipment for mask or circuit repair. It was not until the 1990s that FIB instruments began to be used in research laboratories, and today there are commercial instruments available from multiple manufacturers.…”

Section: Introductionmentioning

confidence: 99%

Focused Ion Beam Microscopy and Micromachining

Volkert¹,

Minor²

2007

MRS Bull.

583

380

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The fairly recent availability of commercial focused ion beam (FIB) microscopes has led to rapid development of their applications for materials science. FIB instruments have both imaging and micromachining capabilities at the nanometer–micrometer scale; thus, a broad range of fundamental studies and technological applications have been enhanced or made possible with FIB technology. This introductory article covers the basic FIB instrument and the fundamentals of ion–solid interactions that lead to the many unique FIB capabilities as well as some of the unwanted artifacts associated with FIB instruments. The four topical articles following this introduction give overviews of specific applications of the FIB in materials science, focusing on its particular strengths as a tool for characterization and transmission electron microscopy sample preparation, as well as its potential for ion beam fabrication and prototyping.

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“…Field-ion energy-deficit measurements [23] allow us to put an upper limit on fhe voltage drop; I estimate this as not move than 2 V, probably less. Hence we obtain R 4 0.09 .…”

Section: Alternative Explanations For Electrically Driven Jetsmentioning

confidence: 99%

The Liquid Metal Ion Source as an Electrically Driven Vena Contracta, and some Comments on LMIS Stability

Forbes

1996

J. Phys. IV France

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Liquid metal ion sources: Mechanism and applications

Cited by 108 publications

References 12 publications

Principles of Electrospray Ionization

Principles of Electrospray Ionization

Focused Ion Beam Microscopy and Micromachining

The Liquid Metal Ion Source as an Electrically Driven Vena Contracta, and some Comments on LMIS Stability

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