ESSCIRC 2004 - 29th European Solid-State Circuits Conference (IEEE Cat. No.03EX705)
DOI: 10.1109/esscirc.2003.1257160
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Low voltage sensing techniques and secondary design issues for sub-90nm caches

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Cited by 5 publications
(2 citation statements)
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“…Genuine current-mode sense-amplifiers have been employed in SRAM applications, where speed is critical during read operation and voltage swings are problematic due to sizing limitation of the bit line drivers [29]- [31]. Similar solutions are applied to global interconnect and are reported to dissipate less power and achieve higher throughput than an interconnect buffered with an optimal number of repeaters [32]- [36].…”
Section: Introductionmentioning
confidence: 99%
“…Genuine current-mode sense-amplifiers have been employed in SRAM applications, where speed is critical during read operation and voltage swings are problematic due to sizing limitation of the bit line drivers [29]- [31]. Similar solutions are applied to global interconnect and are reported to dissipate less power and achieve higher throughput than an interconnect buffered with an optimal number of repeaters [32]- [36].…”
Section: Introductionmentioning
confidence: 99%
“…The voltage-mode circuits included in the study were Cross-coupled Inverter Latch (C2IL) [2] and Alpha Latch [3] and the current-mode included Clamped Bitline Sense Amplifier (CBLSA) [4] and Modified Differential Current Sense Amplifier (MDCSA) [5]. A Charge Transfer Sense Amplifier (CTSA) [5] is also compared. All the circuits were studied for various column heights and were tested for the worst case bitline leakage.…”
Section: Comparison Of Sense Amplifiersmentioning
confidence: 99%