&lt;title&gt;Performance of a large-format charge-injection device&lt;/title&gt;

Zarnowski, Jeffrey J.; Eid, Sayed I.; Arnold, Frank S.; Pace, Matthew A.; Carbone, Joseph; Williams, Bryn

doi:10.1117/12.148589

Cited by 4 publications

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“…This was partly a result of vertical shift register controlled multiplexers at the end of each row. Michon (1987) described replacing the multiplexers with pre-amplifier per row (PPR) architectures, and Zarnowski et al (1993) suggested narrowing the polysilicon crossovers to reduce pattern noise. These measures were introduced to the CID-38 where read noise was reduced to ∼ 250e − (Ninkov et al 1994b).…”

Section: Charge Injection Devicesmentioning

confidence: 99%

Extreme Contrast Ratio Imaging of Sirius with a Charge Injection Device

Batcheldor

Foadi

Bahr

et al. 2016

PASP

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The next fundamental steps forward in understanding our place in the universe could be a result of advances in extreme contrast ratio (ECR) imaging and point spread function (PSF) suppression. For example, blinded by quasar light we have yet to fully understand the processes of galaxy and star formation and evolution, and there is an ongoing race to obtain a direct image of an exoearth lost in the glare of its host star. To fully explore the features of these systems we must perform observations in which contrast ratios of at least one billion can be regularly achieved with sub 0.′′ 1 inner working angles. Here we present the details of a latest generation 32-bit charge injection device (CID) that could conceivably achieve contrast ratios on the order of one billion. We also demonstrate some of its ECR imaging abilities for astronomical imaging. At a separation of two arc minutes, we report a direct contrast ratio of ∆m v = 18.3, log (CR) = 7.3, or 1 part in 20 million, from observations of the Sirius field. The atmospheric conditions present during the collection of this data prevented less modest results, and we expect to be able to achieve higher contrast ratios, with improved inner working angles, simply by operating a CID at a world-class observing site. However, CIDs do not directly provide any PSF suppression. Therefore, combining CID imaging with a simple PSF suppression technique like angular differential imaging, could provide a cheap and easy alternative to the complex ECR techniques currently being employed.

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Section: Charge Injection Devicesmentioning

confidence: 99%

Extreme Contrast Ratio Imaging of Sirius with a Charge Injection Device

Batcheldor

Foadi

Bahr

et al. 2016

PASP

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Charge Injection Device (CID) technology — A solution for photon and particle imaging applications

Wentink¹,

Carbone²

1994

Nuclear Instruments and Methods in Physics Research Section A:

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<title>Active pixel sensors: are CCDs dinosaurs?</title>

1993

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Charge-coupled devices (CCD's) are presently the technology of choice for most imaging applications. In the 23 years since their invention in 1970, they have evolved to a sophisticated level of performance. However, as with all technologies, we can be certain that they will be supplanted someday. In this paper, the Active Pixel Sensor (APS) technology is explored as a possible successor to the CCD.An active pixel is defined as a detector array technology that has at least one active transistor within the pixel unit cell. The APS eliminates the need for nearly perfect charge transfer --the Achilles' heel of CCDs. This perfect charge transfer makes CCD's radiation "soft," difficult to use under low light conditions, difficult to manufacture in large array sizes, difficult to integrate with on-chip electronics, difficult to use at low temperatures, difficult to use at high frame rates, and difficult to manufacture in non-silicon materials that extend wavelength response. With the active pixel, the signal is driven from the pixel over metallic wires rather than being physically transported in the semiconductor.This paper makes a case for the development of APS technology. The state of the art is reviewed and the application of APS technology to future space-based scientific sensor systems is addressed.

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<title>Performance of a large-format charge-injection device</title>

Cited by 4 publications

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Extreme Contrast Ratio Imaging of Sirius with a Charge Injection Device

Extreme Contrast Ratio Imaging of Sirius with a Charge Injection Device

Charge Injection Device (CID) technology — A solution for photon and particle imaging applications

<title>Active pixel sensors: are CCDs dinosaurs?</title>

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