2010
DOI: 10.1016/j.jcrysgro.2010.01.040
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MBE growth of atomically smooth non-polar cubic AlN

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Cited by 52 publications
(48 citation statements)
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“…In addition to this, thermal and chemical stability of AlN films make it suitable for applications in difficult environment. Today, AlN films/coatings have been grown by several methods which include pulsed laser deposition [2], reactive molecular beam epitaxy [3], vacuum arc/cathodic arc deposition [4], DC/RF reactive sputtering [5][6][7], ion beam sputtering [8], metal-organic chemical vapor deposition (MOCVD) [9], and miscellaneous [10] other techniques. Due to simplicity, reproducibility, ease of scaling up, and lower cost, magnetron sputtering is one of the common methods for growing AlN films for various applications.…”
Section: Introductionmentioning
confidence: 99%
“…In addition to this, thermal and chemical stability of AlN films make it suitable for applications in difficult environment. Today, AlN films/coatings have been grown by several methods which include pulsed laser deposition [2], reactive molecular beam epitaxy [3], vacuum arc/cathodic arc deposition [4], DC/RF reactive sputtering [5][6][7], ion beam sputtering [8], metal-organic chemical vapor deposition (MOCVD) [9], and miscellaneous [10] other techniques. Due to simplicity, reproducibility, ease of scaling up, and lower cost, magnetron sputtering is one of the common methods for growing AlN films for various applications.…”
Section: Introductionmentioning
confidence: 99%
“…In order to sustain the cubic phase during the epitaxy it is crucial to maintain an excess of group III elements on the growth surface. It is well established that exposing a c-AlN surface to nitrogen flux leads to the formation of hexagonal AlN clusters [12,13]. We have used a new approach to maintain the excess of group III elements for growth of Al x Ga 1 À x N layers of a wide Al composition range, namely the use of an excess Ga flux.…”
Section: Resultsmentioning
confidence: 99%
“…For GaN we have used the value measured for the bulk free-standing zinc-blende GaN [9] and for AlN we have used the value for the thin c-AlN layers grown on 3C-SiC [12]. The lattice parameter of thin cubic Al x Ga 1 À x N layers changes almost linearly from the value for the cubic GaN to the value for AlN and thus closely follows Vegard's law.…”
Section: Resultsmentioning
confidence: 99%
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“…3 Results and discussion 3.1 Growth The first step is the cleaning of the 3C-SiC substrate by an Al deposition and desorption process, followed by the growth of a 30 nm thick c-AlN barrier layer at 730° C substrate temperature by plasma assisted molecular beam epitaxy (PAMBE) [9]. The RHEED pattern of the AlN surface in Fig.…”
mentioning
confidence: 99%