Measurement of the across-plane conductivity of YSZ thin films on silicon

Navickas, Edvinas; Gerstl, Matthias P.; Friedbacher, Gernot; Kübel, Frank; Fleig, Jürgen

doi:10.1016/j.ssi.2012.01.007

Cited by 31 publications

(23 citation statements)

References 34 publications

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“…As s/r decreases, the region of high current density associated with the MTFB micro‐contact (reaching approximately four times the micro‐contact radius), begins to interfere with the full surface contact, Figure C. Due to this configuration, the current flow is more homogeneous as there is not enough room to spread out and is therefore better fitted with a geometric factor rather than using the spreading resistance equation, Figure , in agreement with previous studies . For all micro‐contact sizes modeled, the calculated conductivity using this equation is within 10% error at an s/r of 0.1 (black squares in Figure A‐C).…”

Section: Discussionsupporting

confidence: 83%

Modeling the influence of two terminal electrode contact geometry and sample dimensions in electro‐materials

et al. 2018

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Various two terminal electrode geometry configurations are commonly employed to probe the electrical properties of materials with the key consideration being how current flows through the sample. Here, finite element modeling is used to simulate the dc electrical response of an electrically homogeneous sample (based on single crystal SrTiO3) using two terminal electrode geometries based on full surface, top‐bottom macro‐contacts as is commonly used when characterizing bulk ceramics or large single crystals and top‐bottom and top‐top micro‐contacts that are used to characterize thin films and local intra‐ and inter‐granular regions in ceramics. Well‐known equations for macro‐ and micro‐contacts are used to calculate the conductivity of the sample and are compared to the intrinsic values to determine their accuracy. A geometric factor returns accurate bulk conductivity values when there is homogeneous current flow whereas the spreading resistance equation gives the most accurate conductivity values for heterogeneous current flow. When micro‐contacts are used, the response is dominated by a small region of high current density in the vicinity of the contact, providing local electrical properties. Interference can occur when regions of high current density overlap, providing a less resistive route for current flow, thus reducing the applicability of the spreading resistance equation. For top‐top micro‐contacts at small separations, the conductivity is overestimated. The accuracy of the spreading resistance equation increases as the contact separation increases and is within 10% error when they are separated by eight times the micro‐contact radius. Convergence of the error to values lower than 10% becomes increasingly difficult and requires excessively large (and experimentally challenging) separation distances. For example, to obtain a result with an error below 5% requires separations in excess of 28 times the micro‐contact radius. Confinement occurs when the sample size limits the ability of the current to spread out from a micro‐contact, thus increasing the resistance. As the sample shape and dimensions can limit current flow, a geometric factor can sometimes be used to determine accurate conductivity values. In some cases, interference can counter‐balance confinement to yield fortuitously accurate conductivity values.

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Section: Discussionsupporting

confidence: 83%

Modeling the influence of two terminal electrode contact geometry and sample dimensions in electro‐materials

et al. 2018

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“…Karthikeyan et al, 68 and Jiang et al 69 also observed similar conductivity increases in YSZ grown on MgO, Al 2 O 3 , and Si substrates. Conductivity increases of similar magnitudes were also observed in gadolinium doped ceria (GDC) by Suzuki et al 70 and Huang et al 71 Multilayered structures studied by Korte, Janek and co-workers [72][73][74][75] have also 77 deposited YSZ on Si (001). Both these studies reported 3-4 times decrease in conductivity compared to polycrystalline YSZ.…”

Section: Interface Effects On Oxygen Diffusionsupporting

confidence: 58%

Microstructure design for fast oxygen conduction

Aidhy

Weber

2015

J. Mater. Res.

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In the past decade, the research in designing fast oxygen conducting materials for electrochemical applications has largely shifted to microstructural features, in contrast to material-bulk. In particular, understanding oxygen energetics in heterointerface materials is currently at the forefront, where interfacial tensile strain is being considered as the key parameter in lowering oxygen migration barriers. Nanocrystalline materials with high densities of grain boundaries have also gathered interest that could possibly allow leverage over excess volume at grain boundaries, providing fast oxygen diffusion channels similar to those previously observed in metals. In addition, near-interface phase transformations and misfit dislocations are other microstructural phenomenon/features that are being explored to provide faster diffusion. In this review, the current understanding on oxygen energetics, i.e., thermodynamics and kinetics, originating from these microstructural features is discussed. Experimental observations, theoretical predictions and novel atomistic mechanisms relevant to oxygen transport are highlighted. In addition, the interaction of dopants with oxygen vacancies in the presence of these new microstructural features, and their future role in the design of future fast-ion conductors, is outlined.

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“…The cross‐plane geometry is also more realistic, because current flows perpendicular to the film plane in most applications, e.g., in micro‐solid oxide fuel cells 32–40. In literature, only few studies on cross‐plane measurements have been reported up to now, and all of them were done on YSZ thin films with columnar microstructures 36, 41–43. To avoid short circuits through pinholes, rather high film thicknesses between 500 nm and 1.5 µm were used 41, 42, or YSZ films as thin as 20 nm were measured together with their Si/SiO x substrate 43.…”

Section: Introductionmentioning

confidence: 99%

Influence of microstructure on the cross‐plane oxygen ion conductivity of yttria stabilized zirconia thin films

Schlupp

Scherrer

et al. 2012

Physica Status Solidi (a)

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The electrical cross-plane conductivity of 8 mol% yttria stabilized zirconia (YSZ) thin films prepared by different deposition techniques, namely aerosol assisted chemical vapor deposition, wet spray pyrolysis (SP), and pulsed laser deposition (PLD), is correlated with their microstructure. Depending on deposition technique and process conditions, microstructures ranging from amorphous to randomly oriented nanocrystalline or columnar with preferred (111) orientation are obtained. Cross-plane AC impedance measurements of these thin films show that the oxygen ion conductivity of randomly oriented nanocrystalline samples is determined by the grain boundaries, which show significantly lower transport properties than the grain interior. In columnar microstructures, the conductivity is determined by ionic transport through the grains only. The same conduction behavior is found for amorphous and randomly oriented microstructures with grain sizes between 3 nm and 9 nm, indicating that no true size effects occur in 8 mol% YSZ.Grain and grain boundary conductivity determined for nanocrystalline 8 mol% yttria stabilized zirconia thin films of different microstructures.

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Measurement of the across-plane conductivity of YSZ thin films on silicon

Cited by 31 publications

References 34 publications

Modeling the influence of two terminal electrode contact geometry and sample dimensions in electro‐materials

Modeling the influence of two terminal electrode contact geometry and sample dimensions in electro‐materials

Microstructure design for fast oxygen conduction

Influence of microstructure on the cross‐plane oxygen ion conductivity of yttria stabilized zirconia thin films

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