2013
DOI: 10.1088/1367-2630/15/12/123007
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Mechanical breakdown of bent silicon nanowires imaged by coherent x-ray diffraction

Abstract: We have developed a method of coherent x-ray diffractive imaging to surmount its inability to image the structure of strongly strained crystals. We used calculated models from finite-element analysis to guide an iterative algorithm to fit experimental data from a series of increasingly bent wires cut into silicon-on-insulator films. Just before mechanical fracture, the wires were found to contain new phase structures, which are identified as dislocations associated with crossing the elastic limit.

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Cited by 9 publications
(10 citation statements)
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“…A related technique, Fourier-transform holography (FTH), solves the phase problem in the Fourier domain by interfering the far field scattering pattern with planewave references. CDI and FTH techniques have provided quantitative, high-resolution images of a variety of samples, including magnetic domains [5][6][7][8], ZnO nanocrystals [9], strained-silicon-on-insulator nanostructures [10], silicon-oninsulator nanowires [11], ceramic nanofoams [12], and biological samples such as yeast cells [13][14][15] and individual virus particles [16]. While improvements to reconstruction algorithms have allowed a broader range of information about the real-space nature of the sample being imaged, such as some knowledge of its composition [17], to serve as constraints on the reconstruction, the requirement of the reconstruction algorithms that the illuminating radiation have both high spatial and temporal coherence has hindered the progress and application of diffractive imaging.…”
Section: Introductionmentioning
confidence: 99%
“…A related technique, Fourier-transform holography (FTH), solves the phase problem in the Fourier domain by interfering the far field scattering pattern with planewave references. CDI and FTH techniques have provided quantitative, high-resolution images of a variety of samples, including magnetic domains [5][6][7][8], ZnO nanocrystals [9], strained-silicon-on-insulator nanostructures [10], silicon-oninsulator nanowires [11], ceramic nanofoams [12], and biological samples such as yeast cells [13][14][15] and individual virus particles [16]. While improvements to reconstruction algorithms have allowed a broader range of information about the real-space nature of the sample being imaged, such as some knowledge of its composition [17], to serve as constraints on the reconstruction, the requirement of the reconstruction algorithms that the illuminating radiation have both high spatial and temporal coherence has hindered the progress and application of diffractive imaging.…”
Section: Introductionmentioning
confidence: 99%
“…A dislocation would cause the bending of the lattice planes surrounding the dislocation. These distortions would cause opposing signs of phase shifts [35,56] since the directions of the distortions around the dislocation are of opposing signs. Indeed, dislocations have a signature phase pattern of a 2π rotation.…”
Section: Resultsmentioning
confidence: 99%
“…The ability of BCDI to image strain in 3D in individual nanocrystals is extremely useful and highly novel. BCDI has been used to obtain the full strain tensor in nanocrystals [31,32] and to study the structure of and strain within nanowires [33][34][35] and other materials [36][37][38]. It has also been applied in the study of dynamic processes such as investigation of lattice dynamics [39].…”
Section: Introductionmentioning
confidence: 99%
“…The ideal sample for BCDI measurements is perfect prismatic-shaped crystals with low strain in their pristine state, so that when strain is induced during the electrochemical reaction it can be observed as a significant phase shift introduced by the strain of the lattice . Crystals with strong intrinsic strains or other mosaic structure are less suitable for BCDI measurements as the phase structure in the pristine image will already be very highly structured and the effects of electrochemistry may be overwhelmed (Shi et al, 2013).…”
Section: Sample Preparationmentioning
confidence: 99%
“…For BCDI phase retrieval to work well, one also requires the Bragg peak to have a well defined intense center. As reported by Shi et al (2013), when strain in the sample is so severe that the Bragg peak shows strong distortion, one must resort to model-based phasing methods to retrieve an image.…”
Section: Sample Screeningmentioning
confidence: 99%