Molecular structure and carrier distributions at semiconductor/dielectric interfaces in organic field-effect transistors studied with sum frequency generation microscopy

Nakai, Ikuyo; Tachioka, Masaaki; Ugawa, A.; Ueda, Tadashi; Watanabe, Keiji; Matsumoto, Yoshiyasu

doi:10.1063/1.3275805

Cited by 25 publications

(41 citation statements)

References 17 publications

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“…An example is shown in Figure 5. The spatial resolution in wide-field SFG can be as high as 2 μ m (89–91), which is much higher than what can be obtained in linear IR microscopy. The higher resolution is a direct consequence of the nonlinear upconversion of an initial IR excitation to a signal in the visible range of the spectrum.…”

Section: Second-order Vibrational Microscopymentioning

confidence: 78%

Biomolecular Imaging with Coherent Nonlinear Vibrational Microscopy

Chung

Potma

2013

Annu. Rev. Phys. Chem.

105

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Optical imaging with spectroscopic vibrational contrast is a label-free solution for visualizing, identifying, and quantifying a wide range of biomolecular compounds in biological materials. Both linear and nonlinear vibrational microscopy techniques derive their imaging contrast from infrared active or Raman allowed molecular transitions, which provide a rich palette for interrogating chemical and structural details of the sample. Yet nonlinear optical methods, which include both second-order sum-frequency generation (SFG) and third-order coherent Raman scattering (CRS) techniques, offer several improved imaging capabilities over their linear precursors. Nonlinear vibrational microscopy features unprecedented vibrational imaging speeds, provides strategies for higher spatial resolution, and gives access to additional molecular parameters. These advances have turned vibrational microscopy into a premier tool for chemically dissecting live cells and tissues. This review discusses the molecular contrast of SFG and CRS microscopy and highlights several of the advanced imaging capabilities that have impacted biological and biomedical research.

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Section: Second-order Vibrational Microscopymentioning

confidence: 78%

Biomolecular Imaging with Coherent Nonlinear Vibrational Microscopy

Chung

Potma

2013

Annu. Rev. Phys. Chem.

105

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“…9-11 IR-visible SFG spectroscopy has also been applied to OFETs to probe the molecular structural changes and charge accumulation processes caused by injected charges. [12][13][14][15][16] In this letter, multilayer OLED devices were investigated by EFI-DR-SFG. Buried layers were probed by applying a bias voltage to multilayer OLED devices during measurements of the SFG under the doubly resonant condition.…”

mentioning

confidence: 99%

“…This observation must be due to the doubleresonance effect, because the output SFG wavelength (in this work, x SFG ¼ x VIS þ x IR % 430 nm) is at the absorption edge of Alq 3 . When a static electric field E 0 is applied to the system, the SFG signal intensity (I SFG ) is given by [7][8][9][10][11][12][13][14][15][16] …”

mentioning

confidence: 99%

Probing buried organic layers in organic light-emitting diodes under operation by electric-field-induced doubly resonant sum-frequency generation spectroscopy

Miyamae

Takada

Tsutsui³

2012

Appl. Phys. Lett.

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“…36 This problem is amplified for low repetition-rate lasers with high pulse energies, since here the single-shot SFG signal should be maximized to avoid extremely long image acquisition times. 34 Here, wide-field SFG microscopy 34,35,54,55 as schematically shown in Fig. 4d presents itself as a complementary approach that solves most of these problems.…”

mentioning

confidence: 99%

Surface Phonon Polariton Resonance Imaging Using Long-Wave Infrared-Visible Sum-Frequency Generation Microscopy

et al. 2019

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We experimentally demonstrate long-wave infrared-visible sum-frequency generation microscopy for imaging polaritonic resonances of infrared (IR) nanophotonic structures. This nonlinear-optical approach provides direct access to the resonant field enhancement of the polaritonic near fields, while the spatial resolution is limited by the wavelength of the visible sum-frequency signal. As a proof-of-concept, we here study periodic arrays of subdiffractional nanostructures made of 4H-silicon carbide supporting localized surface phonon polaritons. By spatially scanning tightly focused incident beams, we observe excellent sensitivity of the sum-frequency signal to the resonant polaritonic field enhancement, with a much improved spatial resolution determined by visible laser focal size. However, we report that the tight focusing can also induce 1 arXiv:1905.12499v1 [physics.optics] 29 May 2019 sample damage, ultimately limiting the achievable resolution with the scanning probe method. As a perspective approach towards overcoming this limitation, we discuss the concept of using wide-field sum-frequency generation microscopy as a universal experimental tool that would offer long-wave IR super-resolution microscopy with spatial resolution far below the IR diffraction limit.Keywords microscopy, infrared, sum-frequency generation, nanophotonics, surface phonon polariton, polar crystal, semiconductor Nanophotonics relies on the subdiffractional localization of light which is typically achieved using large-momentum surface polariton modes. 1,2 This has been demonstrated for a large variety of structures, using both plasmon polaritons in metallic nanoantennas 3-5 as well as phonon polaritons in subdiffractional polar dielectric nanostructures, 6-13 emerging in the visible (VIS) and long-wave infrared (LWIR) spectral region, respectively. Experimental verification of the resulting light localization, however, is inherently challenging since the spatial resolution in optical microscopes is dictated by the diffraction limit. Specifically in the field of LWIR nanophotonics, this paradigm has been very successfully resolved by using scattering-type scanning near-field optical microscopy (s-SNOM) 14,15 and photothermal induced resonance (PTIR) microscopy, 16,17 where the spatial resolution is limited by the nanoscopic size of the metallic probe tip rather than the imaging wavelength. 9,13,18-28 Further approaches implementing hyperlens concepts may provide additional imaging methods for overcoming the challenge for the diffraction limit as well. [29][30][31] In biology and chemistry, however, the traditional way to achieve image resolution below the diffraction limit has been to harvest nonlinear-optical effects, such as stimulated emission depletion. 32 Infrared (IR) super resolution imaging, on the other hand, has used nonlinear techniques such as IR-VIS sum-frequency generation 33-37 (SFG) or coherent anti-stokes Raman scattering 38,39 microscopy, providing surface-specific and bulk vibrational contrast,

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Molecular structure and carrier distributions at semiconductor/dielectric interfaces in organic field-effect transistors studied with sum frequency generation microscopy

Cited by 25 publications

References 17 publications

Biomolecular Imaging with Coherent Nonlinear Vibrational Microscopy

Biomolecular Imaging with Coherent Nonlinear Vibrational Microscopy

Probing buried organic layers in organic light-emitting diodes under operation by electric-field-induced doubly resonant sum-frequency generation spectroscopy

Surface Phonon Polariton Resonance Imaging Using Long-Wave Infrared-Visible Sum-Frequency Generation Microscopy

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