New Method for Noise-Parameter Measurement of a Mismatched Linear Two-Port Using Noise Power Wave Formalism

“…The other receiver characteristics are calculated from the matrix in equation 1 in which the first line and the first column are removed. The further equations in [3] need to know ∆f. It must be carefully measured without taking into account the VNA indication.…”

Section: Set-up Calibration Without a Hot Noise Sourcementioning

confidence: 99%

Calibration for noise parameters measurement with a VNA and without a hot noise source

Pasquet

Huang

Qiu

et al. 2013

81st ARFTG Microwave Measurement Conference

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“…The method of Simpson et al, is based on the traditional noise parameter measurement method: by measuring the noise figure for the source impedance change, they measured Fmin, Rn, and Γopt [4]. On the other hand, the work in [5] and [6] measures a noise correlation matrix and computes noise parameters Fmin, Rn, and Γopt. The method described here can be used for their verification irrespective of noise parameter measurement method used.…”

Section: Introductionmentioning

confidence: 99%

Optimal Design of Passive Devices for Verifying On-Wafer Noise Parameter Measurement Systems

Liu

et al. 2020

IEEE Trans. Instrum. Meas.

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We propose the optimal design of passive devices that can be used to verify on-wafer noise parameter measurement systems. The design principles result from obtaining the minimum relative uncertainties of four noise parameters: Fmin, Rn, |Γopt|, and ∠Γopt for a wide range of S-parameters of a passive two-port network. A Monte-Carlo (MC) method has been used for the investigation and the simulation results show that |S11| plays a primary role in deciding the optimal design and must be within 0.5 to 0.6. |S21| plays a secondary role in the design and ideally it should be as small as possible. Based on these findings, we designed and fabricated three planar attenuators on a semi-insulating GaAs substrate. The test results (at up to 40 GHz) show excellent agreement with the simulation. This is the first time that the effect of different designs of passive verification devices on the system noise measurement has been analysed and the design principles of optimal passive devices are given.

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New Method for Noise-Parameter Measurement of a Mismatched Linear Two-Port Using Noise Power Wave Formalism

Cited by 16 publications

References 13 publications

A Complete Noise- and Scattering-Parameters Test-Set

A Complete Noise- and Scattering-Parameters Test-Set

Calibration for noise parameters measurement with a VNA and without a hot noise source

Optimal Design of Passive Devices for Verifying On-Wafer Noise Parameter Measurement Systems

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