2003
DOI: 10.1109/jmems.2003.809974
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Novel fabrication method for surface micromachined thin single-crystal silicon cantilever beams

Abstract: This paper describes a novel technique for the fabrication of surface micromachined thin silicon cantilever beams using merged epitaxial lateral overgrowth (MELO) of silicon and chemical-mechanical polishing (CMP). The objective is to demonstrate the feasibility of using this novel technique for the fabrication of arrays of ultrathin, low-stress, single-crystal silicon cantilever beams for use in ultrahigh sensitivity surface-stress or resonant-frequency-based chemical or biological detection schemes. The proc… Show more

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Cited by 29 publications
(19 citation statements)
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“…7 shows that for a weaker coupling spring, the sensitivity of the amplitude ratio is increased. The sensitivity of the device has been calculated according to (7) for both values of coupling spring and is shown in Tab. 1.…”
Section: Experiments and Resultsmentioning
confidence: 99%
See 1 more Smart Citation
“…7 shows that for a weaker coupling spring, the sensitivity of the amplitude ratio is increased. The sensitivity of the device has been calculated according to (7) for both values of coupling spring and is shown in Tab. 1.…”
Section: Experiments and Resultsmentioning
confidence: 99%
“…The detection of various biological elements is 10 a widely researched area of resonant mass sensing with functionalised surfaces promoting the attachment of the target analytes. For example, the growth of Escherichia Coli [5] and the adsorption of spores of Bacillus anthracis [6] and Listeria innocua [7] on the surface of a cantilever have been demonstrated previously.…”
Section: Introductionmentioning
confidence: 94%
“…The substrate curvature technique has long been applied to both complete substrates 1,4,5 and cantilever beams. [6][7][8] Traditionally, mapping of the thermomechanical behavior of a film as a function of composition has been accomplished by measuring the residual stress in the film as a function of temperature, one film at a time. This process is very time consuming if one is interested in measuring properties over a wide range of compositions and temperatures.…”
Section: High-throughput Analysis Of Thin-film Stresses Using Arrays mentioning
confidence: 99%
“…9 The process flow involves using merged epitaxial lateral overgrowth (MELO) and chemical mechanical polishing (CMP) of single crystal silicon. MELO can be regarded as an extension of selective epitaxial growth (SEG) and epitaxial lateral overgrowth (ELO).…”
Section: A Cantilever Beam Fabrication and Mechanical Characterizationmentioning
confidence: 99%