OBT implementation on Gm-C filters without self-tuning capability

Petrashin, Pablo; Dualibe, Carlos

doi:10.1109/iscas.2011.5938117

Cited by 6 publications

(7 citation statements)

References 8 publications

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“…It is assumed here that a fault is detected when the oscillation frequency or amplitude falls outside of a tolerance band of ±5% from the nominal values simulated in the TT case. This is in keeping with the state-of-the-art in OBT techniques [14] and also allows for nonfaulty FF (which features a +2,39% increase in 0 compared to the TT simulated case), FS (−0,34% 0 compared to the TT), SF (+1,01%), and SS (−2,28%) circuits to pass the test. Table 3 presents the simulation results for short circuit faults that do not result in a loss of oscillation output altogether, as was the case with all open circuit faults.…”

Section: Fault Modelingmentioning

confidence: 53%

“…The conventional OBT procedure is applied [14], whereby the circuit is switched into this oscillating condition and its output voltage amplitude and oscillation frequency are compared to that of the nonfaulty output in Figure 5.…”

Section: Reference Nodementioning

confidence: 99%

“…As has been proposed in previous literature on OBT [8][9][10]14] open circuit faults are modeled by a 10 MΩ resistor, while short circuit faults are modeled by a 10 Ω resistor. It is assumed here that a fault is detected when the oscillation frequency or amplitude falls outside of a tolerance band of ±5% from the nominal values simulated in the TT case.…”

Section: Fault Modelingmentioning

confidence: 99%

“…The state-of-the-art in OBT testing [8][9][10]14] uses 10 Ω resistors to represent short circuit faults and 10 MΩ resistors to represent open circuit faults. As open and short circuits on-chip may assume a wide variety of impedance values [18], it would be prudent to analyse the effect of substituted impedance value variation on the OBT technique.…”

Section: Evaluation Of Short Circuit and Open Circuit Impedance Valuesmentioning

confidence: 99%

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Oscillation-Based Test Applied to a Wideband CCII

et al. 2017

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Oscillation-based testing (OBT) has been proven to be a simple, yet effective VLSI test for numerous circuit types. This paper investigates, for the first time, the application of OBT verification for second generation current conveyors (CCIIs). The OBT is formed by connecting the CCII into a simple Wien bridge oscillator and monitoring both the amplitude and frequency of oscillation. The fault detection rate, taking into account both the open and short circuit fault simulation analyses, indicates 96.34% fault coverage using a combination of amplitude and frequency output sensing in all technology corners. The only nondetected faults are short circuits between DD and SS , which can be detected using other techniques such as IDDQ testing. This method is found to be sensitive to resistor and capacitor process variation in the Wien bridge oscillator, but mitigating test steps are proposed.

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Section: Fault Modelingmentioning

confidence: 53%

Section: Reference Nodementioning

confidence: 99%

Section: Fault Modelingmentioning

confidence: 99%

Section: Evaluation Of Short Circuit and Open Circuit Impedance Valuesmentioning

confidence: 99%

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Oscillation-Based Test Applied to a Wideband CCII

et al. 2017

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“…Adopting a second-order Gm-C structure as a case study, [33] presented an OBT scheme that makes use of a non-linear characteristic in the feedback loop and explored the test quality for short circuit and open circuit faults. In order to deal with untuned filters, [34] presented enhanced OBT scheme that performs a relative comparison between two oscillation frequencies and applied the scheme to Gm-C band-pass filter without tuning capability. [35] proposed a novel circuit structure based on a custom Schmitt trigger comparator and evaluated the test quality by adopting a second-order band pass filter as a case.…”

Section: Introductionmentioning

confidence: 99%

Oscillation-Based DFT for Second-Order Bandpass OTA-C Filters

Hasan

Yanqing

Sun

2017

Circuits Syst Signal Process

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This paper describes a design for testability technique for second-order bandpass operational transconductance amplifier and capacitor filters using an oscillation-based test topology. The oscillation-based test structure is a vectorless output test strategy easily extendable to built-in self-test. The proposed methodology converts filter under test into a quadrature oscillator using very simple techniques and measures the output frequency. Using feedback loops with nonlinear block, the filter-to-oscillator conversion techniques easily convert the bandpass OTA-C filter into an oscillator. With a minimum number of extra components, the proposed scheme requires a negligible area overhead. The validity of the proposed method has been verified using comparison between faulty and faultfree simulation results of Tow-Thomas and KHN OTA-C filters. Simulation results in 0.25μm CMOS technology show that the proposed oscillation-based test strategy for OTA-C filters is suitable for catastrophic and parametric faults testing and also effective in detecting single and multiple faults with high fault coverage.

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Design for testability of high‐order OTA‐C filters

Hasan

Yanqing

Sun

2016

Circuit Theory & Apps

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This is the peer-reviewed version of the following article: Masood-ul Hasan, Yanqing Zhu, and Yichuang Sun, ???Design for testability of high-order OTA-C filters???, International Journal of Circuit Theory and Applications, Vol. 44 (10): 1859-1873, October 2016, which has been published in final form at doi: 10.1002/cta.2200. This article may be used for non-commercial purposes in accordance with Wiley Terms and Conditions for Self-Archiving. Copyright ?? 2016 John Wiley & Sons, Ltd.A study of oscillation-based test for high-order Operational Transconductance Amplifier-C (OTA-C) filters is presented. The method is based on partition of a high-order filter into second-order filter functions. The opening Q-loop and adding positive feedback techniques are developed to convert the second-order filter section into a quadrature oscillator. These techniques are based on an open-loop configuration and an additional positive feedback configuration. Implementation of the two testability design methods for nth-order cascade, IFLF and leapfrog (LF) filters is presented, and the area overhead of the modified circuits is also discussed. The performances of the presented techniques are investigated. Fourth-order cascade, inverse follow-the-leader feedback (IFLF) and LF OTA-C filters were designed and simulated for analysis of fault coverage using the adding positive feedback method based on an analogue multiplexer. Simulation results show that the oscillation-based test method using positive feedback provides high fault coverage of around 97%, 96% and 95% for the cascade, IFLF and LF OTA-C filters, respectively. Copyright ???? 2016 John Wiley & Sons, Ltd

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OBT implementation on Gm-C filters without self-tuning capability

Cited by 6 publications

References 8 publications

Oscillation-Based Test Applied to a Wideband CCII

Oscillation-Based Test Applied to a Wideband CCII

Oscillation-Based DFT for Second-Order Bandpass OTA-C Filters

Design for testability of high‐order OTA‐C filters

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