2013
DOI: 10.1016/j.solmat.2013.03.003
|View full text |Cite
|
Sign up to set email alerts
|

Optical absorptivity and recombination losses: The limitations imposed by the thickness of absorber layer in CdS/CdTe solar cells

Help me understand this report

Search citation statements

Order By: Relevance

Paper Sections

Select...
3
1

Citation Types

1
24
0
1

Year Published

2014
2014
2023
2023

Publication Types

Select...
6
1
1

Relationship

0
8

Authors

Journals

citations
Cited by 48 publications
(26 citation statements)
references
References 19 publications
1
24
0
1
Order By: Relevance
“…6 shows the measured data (symbol) and the best fitted simulation (red line) of sample B 3 . The best simulation adopts some reasonable parameters such as depletion region depth b = 15 nm, diffusion length of minor carriers L = 150 nm (Kosyachenko et al, 2013) and the width of deplete region W = 1200 nm , which quite agree with the measured data. The best simulation indicates that x = 0.15 and y = 0.1.…”
Section: Resultssupporting
confidence: 73%
See 2 more Smart Citations
“…6 shows the measured data (symbol) and the best fitted simulation (red line) of sample B 3 . The best simulation adopts some reasonable parameters such as depletion region depth b = 15 nm, diffusion length of minor carriers L = 150 nm (Kosyachenko et al, 2013) and the width of deplete region W = 1200 nm , which quite agree with the measured data. The best simulation indicates that x = 0.15 and y = 0.1.…”
Section: Resultssupporting
confidence: 73%
“…Because the long wavelength photons have not been absorbed sufficiently when they pass through the narrow depletion region, the number of light-induced carriers corresponding to long wavelength decreased. Our simple method successfully reveals the main characteristic at the blue absorption edge which is often ignored by other reports (Kosyachenko et al, 2013). As is shown in the inset of Fig.…”
Section: Resultsmentioning
confidence: 62%
See 1 more Smart Citation
“…The increase in the thickness of thin film with the substrate temperature [76] is related with the decrease in sticking coefficient as well as the increase in the density of the film due to crystallization. The absorber layers in PV technology are categorized according to their thickness represented in Figure 8 [77][78][79][80][81]. The thinnest material used in thin film PV technology is CuInSe 2 while the thickest one is c-Si.…”
Section: Czts Thin Filmsmentioning
confidence: 99%
“…Відмінності між двома пристроями в основному конструктив-ні, що не має принципового значення з точки зору фізики процесів, що відбуваються. Тому моделі, розроблені для інтерпретації харак-теристик CdTe сонячних елементів, можуть бути застосовані до CIGS пристрою з деякою корекцією [3,4].…”
unclassified