Solid State Communications
 2004
DOI: 10.1016/j.ssc.2004.09.017
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Optical properties of high-Al-content crack free AlxGa1−xN (x<0.67) films grown on Si(111) by molecular-beam epitaxy

F. Natali
1
,
David Byrne
2
,
M. Leroux
3
et al.
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