Optical vector analysis with attometer resolution, 90-dB dynamic range and THz bandwidth

Qing, Ting; Li, Shupeng; Tang, Zhenzhou; Gao, Bindong; Pan, Shilong

doi:10.1038/s41467-019-13129-x

Cited by 42 publications

(9 citation statements)

References 39 publications

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“…There should also be an important reminder that the aforementioned methods are not contradictory to each other, and they can be combined to exert greater advantages. For example, a few months ago in 2019, T. Qing and S. Pan have demonstrated an OVA with attometer resolution, 90-dB dynamic range and THz bandwidth by combining the advantages of the asymmetric DSB-OVA and the OFC-based OVA [91].…”

Section: O/o Device Measurementmentioning

confidence: 99%

Accurate Calibration and Measurement of Optoelectronic Devices

Zhang

Chen

et al. 2021

J. Lightwave Technol.

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Frequency responses of optoelectronic devices are essential to obtain the precise performance of electrical-to-optical-to-electrical signal conversion or optical signal processing. We reviewed the development of optical or electrical measurement methods proposed for characterizing electrical/optical (E/O) devices, optical/electrical (O/E) devices and optical/optical (O/O) devices in the frequency domain from the perspective of accurate calibration standard. It has been found that full calibrated E/O or O/E measurement requires at least an optoelectronic thru standard for the conversion between optical and electrical domains, and an electrical port extension for de-embedding the error or adapter network of microwave source or detector. The indetermination problem still exists in most O/E and E/O device characterization, which appears in different forms for different measurement techniques. Nevertheless, it should be noticed that obtaining an optoelectronic thru standard can be transferred to characterizing a microwave source or detector in the electrical domain, and a precise electrical calibration standard is much easier to be obtained as compared with an optoelectronic calibration standard. Therefore, the calibration standard transfer from optical to electrical domain is a prominent approach to solve the indetermination problem.

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Section: O/o Device Measurementmentioning

confidence: 99%

Accurate Calibration and Measurement of Optoelectronic Devices

Zhang

Chen

et al. 2021

J. Lightwave Technol.

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“…To simultaneously solve the problems described above, OVAs based on optical dual-sideband (ODSB) modulation were created [18][19][20][21][22][23][24][25][26][27][28][29][30][31][32][33][34][35]. They have the following advantages: A doubled measurement frequency range up to 80 GHz with an element base based on lithium niobate (LiNbO 3 ), and an ultrahigh resolution of about 667 kHz, which depends on the quantity of control points of measurements of the electrical vector network analyzer, and which can be increased.…”

Section: Ova Based On Optical Double-sideband Modulationmentioning

confidence: 99%

“…The disadvantage of this approach is that the sidebands and the carrier are separated physically, which causes significant phase noise, due to which it is impossible to obtain the phase response of the device under test. However, the application of this method together with the method described in [17] made it possible to create an OVA with attometer resolution and a bandwidth of the order of THz [25]. Therefore, high resolution is possible due to the use of an advanced element base such as a laser with a linewidth of 300 Hz.…”

Section: Ova Based On Asymmetric Odsbmentioning

confidence: 99%

Ultrahigh-Resolution Optical Vector Analyzers

et al. 2020

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The optical vector analyzer is a device used to measure the magnitude, phase responses, and other parameters of optical devices. There have been increasingly higher demands placed on optical vector analyzers during the development of optical technologies, which are satisfied by the creation of new devices and their operating principles. For further development in this area, it is necessary to generalize the experience gained during the development of optical vector analyzers. Thus, in this report, we provide an overview of all the basic types of approaches used for the realization of optical vector analyzers, including the advanced ones with the best performances. The principles of their working, as well as their associated advantages, disadvantages, and existing solutions to the identified problems, are examined in detail. The presented approaches could be of value and interest to those working in the field of laser dynamics and optical devices, as we propose one use of the optical vector analyzer as being the characterization of Fano resonance structures.

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“…Internally swept laser may scan a wide spectrum over 100 nm range with poor nonlinearity. Relatively, external modulation [39][40][41] using the chirped electrical signal is an effective way to realize the theoretical sub-MHz resolution with tens of GHz frequency range limited by modulators and RF generators.…”

Section: Introductionmentioning

confidence: 99%

Real-time spectral interleaved electro-optic dual-comb spectroscopy

Fan

Wang

et al. 2020

Preprint

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Optical frequency comb with evenly spaced lines over a broad bandwidth has revolutionized the fields of optical metrology and spectroscopy. Here, we propose an electro-optic dual-comb spectroscopy to real-time interleave the spectrum with high resolution, in which two electro-optic frequency combs are seed by swept light source. An interleaved spectrum with a high resolution is real-time recorded by the sweeping probe comb without gap time, which is multi-heterodyne detected by the sweeping local comb. The proposed scheme measures a spectrum spanning 304 GHz in 1.6 ms with a resolution of 1 MHz, and reaches a spectral sampling rate of 1.9*108 points/s under Nyquist-limitation. A reflectance spectrum is measured with a calculated figure-of-merit of 4.2*108, which shows great prospect for fast and high-resolution applications.

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Optical vector analysis with attometer resolution, 90-dB dynamic range and THz bandwidth

Cited by 42 publications

References 39 publications

Accurate Calibration and Measurement of Optoelectronic Devices

Accurate Calibration and Measurement of Optoelectronic Devices

Ultrahigh-Resolution Optical Vector Analyzers

Real-time spectral interleaved electro-optic dual-comb spectroscopy

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