Proceedings of the IEEE 1995 Custom Integrated Circuits Conference
DOI: 10.1109/cicc.1995.518183
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PCHECK: a delay analysis tool for high performance LSI design

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Cited by 6 publications
(3 citation statements)
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“…In [9] the RC load was modeled from the t α f α t in C L , ( ) = driving point admittance point of view as a π-circuit, while the input signal was represented by three parameters. This approach increases the number of SPICE runs required for characterization to very high levels (for example, from 16 to 4096 when considering every parameter sampled in 4 points).…”
Section: Waveform-based Gate Delay Modelsmentioning
confidence: 99%
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“…In [9] the RC load was modeled from the t α f α t in C L , ( ) = driving point admittance point of view as a π-circuit, while the input signal was represented by three parameters. This approach increases the number of SPICE runs required for characterization to very high levels (for example, from 16 to 4096 when considering every parameter sampled in 4 points).…”
Section: Waveform-based Gate Delay Modelsmentioning
confidence: 99%
“…Therefore, (9) where Z ji (s) is the transimpedance from node j to node i (Z ji (s)=Z ij (s) since the RC circuits are reciprocal). It should be noted that the average voltage principle is mathematically equivalent to the current averaging principle in [3].…”
Section: "Ceff" Approach For Capacitively Coupled Rc Interconnectmentioning
confidence: 99%
“…An accurate four parameter model for signal waveforms has been presented in [3] but it increases pre-characterization complexity by requiring a 4-dimensional table to store input information for gate instead of the one-dimensional table required for a ramp approximation. A 2-ramp model has been presented in [4] and it provides good accuracy for most of the signals. However, the model is hard to use because of its piecewise description and there is no clear deterministic method to determine when the model is applicable.…”
mentioning
confidence: 99%