Photoelectron emission for layers of finite thickness

Theory of the formation of the energy spectra of reflected charged particles

“…To calculate , a large number of codes such as DOME [13] and DISORT [14] were developed and approbated. The calculations carried out using (1.6) coincided with those carried out using the DOME [13] and DISORT [14] codes in all cases given in [3,15] with almost zero dispersion. The calculations were carried out using formula (6), in which the differential cross sections for elastic scatter ing were determined in accordance with [10] and the inelastic cross sections were determined using the TPP 2M formula [16].…”

Angle-resolved photoelectron spectra of layers of finite thickness

“…Tradi tionally, the influence of the elastic scattering process on the XPS signal is taken into account either analyti cally within the framework of the transport approxi mation [1,2,7] or numerically on the basis of the Monte Carlo (MC) simulation [1,2]. The authors of [8] showed that the transport approximation involves significant error and the process of MC simulation requires long times. This fact makes MC simulation ineffective for solving inverse problems by means of the fitting procedure.…”

“…The boundary value problem for the photoelectron transport equation was solved using the invariant embedding method [8,12,23]. As shown in [8], con sistent description of angle resolved photoemission spectra leads to the necessity to simultaneously solve a system of equations for the functions of reflection R(z, Δ, Ω 0 , Ω), transmission T(z, Δ, Ω 0 , Ω), and pho toelectron emission flux density Q(z, Δ, Ω 0 , Ω).…”

“…As shown in [8], con sistent description of angle resolved photoemission spectra leads to the necessity to simultaneously solve a system of equations for the functions of reflection R(z, Δ, Ω 0 , Ω), transmission T(z, Δ, Ω 0 , Ω), and pho toelectron emission flux density Q(z, Δ, Ω 0 , Ω). Here, z is the layer thickness, Δ = E 0 -E is the electron energy losses, and Ω 0 = (μ 0 , ϕ 0 ) and Ω = (μ, ϕ) are the probing and viewing directions.…”

Intrinsic excitation effect for the Al and Mg samples XPS analysis

“…Afanas'ev, A. S. Gryazev, P. S. Kaplya, and Y. O. Andreyeva National Research University "Moscow Power Engineering Institute," st. Krasnokazarmennaya 14, Moscow, 111250 Russia e mail: GryazevAS@gmail.comthe X ray and electron probing of Mg and Al are described using absolutely identical cross sections ω in (Δ) (specific cross section for each element). The and values for photoelectrons and Auger electrons will be determined based on numerical solutions to the equations obtained by invariant imbedding methods[6,7].EQUATIONS FOR DESCRIBING THE X RAY PHOTOELECTRON AND AUGER EMISSIONS OF SEMI INFINITE TARGETSWe describe the energy and angular distributions of photoelectrons and Auger electrons based on expres sions for the flux densities of photoelectrons, and Auger electrons,…”