2006
DOI: 10.1364/ao.45.006038
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Precise determination of the dielectric constant and thickness of a nanolayer by use of surface plasmon resonance sensing and multiexperiment linear data analysis

Abstract: Surface plasmon resonance (SPR) sensing and an enhanced data analysis technique are used to obtain precise predictions of the dielectric constant and thickness of a nanolayer. In the proposed approach, a modified analytical method is used to obtain initial estimates of the dielectric constants and thicknesses of the metal film and a nanolayer on the sensing surface of a SPR sensor. A multiexperiment data analysis approach based on a two-solvent SPR method is then employed to improve the initial estimates by su… Show more

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Cited by 11 publications
(6 citation statements)
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“…It could be argued that the increased use of MIPs in sensor development has been in part driven by developments in MIP formats, not least by the establishment of reproducible strategies for thin film, fiber and (nano)particle preparation. Optical,…”
Section: Applicationsmentioning
confidence: 99%
“…It could be argued that the increased use of MIPs in sensor development has been in part driven by developments in MIP formats, not least by the establishment of reproducible strategies for thin film, fiber and (nano)particle preparation. Optical,…”
Section: Applicationsmentioning
confidence: 99%
“…Change in refractive index changes the value of the resonance parameter. To excite surface plasmons, generally, a prism is used [2][3][4][5][6][7][8][9]. The prism-based SPR sensing device has a number of shortcomings such as its bulky size and the presence of various optical and mechanical (moving) parts.…”
Section: Introductionmentioning
confidence: 99%
“…The reflectivity profiles of the four silver layers at diverse incident angles were collected by tuning the incident angles with a motorized goniometer; the results are presented in Figure S1. After applying a fitting approach, the thicknesses of the four silver layers were estimated to be approximately 29, 37, 45, and 52 nm, respectively.…”
Section: Methodsmentioning
confidence: 99%
“…The reflectivity profiles of the four silver layers at diverse incident angles were collected by tuning the incident angles with a motorized goniometer; the results are presented in Figure S1. After applying a fitting approach, 34 The SPCE substrates were then soaked in 1 mM 2aminoethanethiol hydrochloride in ethanol solution for 6 h, rinsed three times with ethanol, and dried in a stream of nitrogen to form a self-assembled monolayer and to complete the surface functionalization of the silver layers. After performing silver-layer coating on the substrate surface, we immediately subjected SPCE substrates to the thiolate protection process to reduce the oxidation of the silver layer.…”
Section: ■ Experimental Sectionmentioning
confidence: 99%